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The Materials Science Center at the University of Wisconsin-Madison

The central MSC facility has provided materials researchers and industrial clients with electron microscopy imaging and analytical analysis, surface analysis and x-ray diffraction serves for over 25 years. MSC houses:
 

  • J.A. Woollam Variable Angle Spectroscopic Ellipsometer (VASE) and Infrared VASE (IR-VASE) systems (coming in February, 2016)
  • Cameca Local Electrode Atom Probe
  • Three scanning electron microscopes with Electron Dispersive X-ray spectrometers
  • Four transmission electron microscopes, with Cryo TEM tomography and an FEI Titan aberration corrected (S)TEM
  • A surface analysis instrument: a Thermo Fisher k-alpha X-Ray Photoelectron Spectrometer
  • Two atomic force microscopes including a Bruker Catalyst BioAFM
  • A dual-beam focused ion beam instrument
  • A confocal micro-Raman spectrometer (Labram Aramis JY)
  • A micro-FT-IR (Thermo Nicolet)
  • A Zeiss 510 Confocal Microscope
  • A small-angle x-ray diffractometer (SAXS)
  • Three additional Diffractometers
  • A ZYGO Optical Interferometer
  • A Horiba Nanolog spectrofluorometer
  • A UV/VIS Dual Beam Fluorometer

For use, questions or more information, please contact the DIrector of MRSEC facilities:

Dr. Felix Lu

(608) 262-6099

felix.lu@wisc.edu

 

Instruments

  1. PANalytical X'Pert PRO X-Ray Diffractometer (XRD)

    High Resolution XRD for Rocking curves and Reciprocal space maps.Six-axis sample stage on high resolution goniometer. Absolute angular resolution = 0.0001 degrees.

  2. Stoe X-ray Diffractometer XRD

    The Stoe instrument is a high-resolution x-ray diffractometer.Standard Bragg-Brentano goniometer and a focussed beam Transmission goniometer
    Multiple stages to accommodate many specimen types
    Parallel optics attachment for grazing incidence studies of thin films
    High temperature furnaces for phase transition studies
    Position sensitive detector (PSD) for rapid parallel data collection
    Monochromators to eliminate fluorescence artifacts

  3. Bruker Bioscope Catalyst Atomic Force Microscope (AFM, Bio-AFM, Scanning Probe Microscope (SPM))

    Bruker's latest innovations, including Peak Force Tapping and the new Nanomechanics Package, significantly expands BioAFM applications in mechanobiology research and expands support for a lower modulus range covering live cells and tissues. With its open-access design, integrated software for combined AFM and fluorescence imaging, along with the bio-friendly features and accessories, the Bioscope Catalyst is the most integrated and easiest to use life science AFM available.

  4. Bruker D8 Discover Diffractometer X-Ray Diffractometer (XRD)

    Synopsis:
    The Bruker D8 Discover diffractometer is ideally suited for rapid phase identification, stress analysis, and texture determination. It also has mapping capabilities with ~0.1 mm lateral resolution and can be configured for small angle x-ray scattering (SAX).

    Advanced X-ray Diffraction System for Materials Research Applications

  5. Cameca (Imago) Local Electrode Atom Probe (LEAP)

    The LEAP Si is a high performance atom probe microscope which provides nano-scale surface, bulk and interfacial materials analysis of simple and complex structures with atom-by-atom identification and accurate spatial positioning.
    The system works using the principle of field evaporation, whereby a strong electric field applied to the specimen is sufficient to cause removal of atoms by ionization. Atom removal is triggered either via a voltage or laser pulse applied to the sample.

  6. Confocal Laser Scanning Microscope (LSM)

    Zeiss 510 Meta Confocal Laser Scanning Microscope with an Axiovert 200M inverted microscope, 2 PMT detectors and the META detector. With the META detector, the emission is projected onto 32 channels for spectral separation. These detectors allow for the simultaneous imaging of several different fluorophores not limited by the available emission filters. DAPI, FITC and Rhodamine filter cubes. DIC imaging. Confocal images can be taken simultaneously with transmission images. Motorized x- y stage. Reflectance confocal to image non-transparent samples.

  7. CryoUltraMicrotome

    The Ultramicrotome Leica EM UC7 provides easy preparation of semi- and ultrathin sections as well as perfect, smooth surfaces of biological and industrial samples for TEM, SEM, AFM and LM examination. Equipped with EM FC7 cryo option.

  8. Digital Instruments Atomic Force Microscope (AFM, SPM)

    The MultiMode AFM offers multiple SPM modes, including AFM, ECAFM, ECSTM, STM and TappingMode.

  9. FEI Titan Aberration-corrected (S)TEM

    This FEI STEM instrument is configured with a CEOS probe-side aberration corrector, which provides revolutionary performance in STEM imaging and microanalysis. Imaging single atoms, and nanoscale Chemical and Structure analysis. With <0.08 nm spatial resolution Zcontrast STEM imaging, <0.1 nm spatial resolution HRTEM imaging. It is fully equipped for analytical analysis with EDS and electron energy loss spectrometers.

  10. FEI Vitrobot

    Plunge Feeze CEVS system automadited to prepare vitrified TEM sections of aqueous samples, biological or polymer thin sections.

  11. FESEM/EDS

    The LEO 1530 uses a Schottky-type field-emission electron source. The Gemini optical column has no crossovers and utilizes a magnetic/electrostatic objective lens for outstanding imaging capabilities, especially at low voltage (due to reduced chromatic aberration). NORAN EDS and TSL EBSD installed.

  12. FESEM/EDS/EBSD

    The LEO 1530 uses a Schottky-type field-emission electron source. The Gemini optical column has no crossovers and utilizes a magnetic/electrostatic objective lens for outstanding imaging capabilities, especially at low voltage (due to reduced chromatic aberration.EDS with SSD detector. Large area fast BSE detector.

  13. Focussed Ion Beam FIB/FESEM

    The 1540XB CrossBeam? workstation is the perfect solution for three dimensional analysis with no compromises on SEM imaging capabilities The stage is fully mechanically eucentric with compucentric rotate and tilt capability. Versatile multi-channel gas injection system for ion beam deposition of metals or insulators and for enhanced etching. Options including a 5 gas injector system, an in situ micromanipulator, and SE, Inlens SE, Inlens BSE, STEM and EDS detectors.

  14. Horiba Jvon-Yobin Aramis Confocal Raman Microscope

    Confocal Raman Microscope. Automated stage allows for spectral imaging of raw or processed spectral measurements. Automated notch filters & Quad grating turret, for spectral range from UV to NIR. Variable confocal pinhole aperature. Excitation sources at 442/335 nm (from He-Cd laser), 532 nm, 633 nm, and 785 nm.

  15. Hysitron TI950 Triboindenter
  16. Mirco FT-IR Spectrometer

    Thermo Nicolet Magna 550 FT-IR bench with a NICPLAN FT-IR Microscope with computer controlled Stage. Latest Omnic/Atlas software for spectral mapping of areas by stage scanning. Bulk and Micro FT-IR measurements on a variety of samples.

  17. NanoMill

    The NanoMill system features gaseous ion source technology that results in ion energies as low as 50eV and a beam size as small as 2 microns. It allows specimens to be prepared without amorphization, implantation, or re-deposition. The ion beam can be targeted to a specific area of interest. A secondary electron detector (SED) is used to image the ion-induced secondary electrons that are generated from the targeted area of the specimen.

  18. Scanning Auger Microscope

    Scanning Auger microscope. FE Source with <100na current, variable KV from 0.1 to 25 KV. Argon ION sputtering for depth profiles. Same spectral resolution as XPS. Beam spot size of ~15nm at 25 KV.

  19. Small-angle X-ray Scattering System XRD

    SAXS with micro focus Cu sealed tube. With cross coupled multilayer mirrors operates at 40 W.and 20 um by 20 um source size. Automatic multiple sample scanning capability and Heating and cooling: Linkam temperature stage. A liquid cell is available.Sample to detector length: 2 meters. Detector is 2-dimensional multi-wire with 1024 by 1024 wires over a 6-inch area

  20. Tecnai Cryo Transmission Electronc Microscope (TEM)

    A state of the art Technai T12 transmission electron microscope with high quality digital imaging capabilities. The electron microscope is the standard for sub-cellular ultrastructural imaging at high magnification. Equipped for cryoTEM.

  21. Tecnai TF-30 300KV Field Emission Scanning Transmission Electron Microscope (FE STEM)

    This 300 KV STEM is equipped with a Field Emmison source, and equiped for cyro samples, and normal hard materials work. With an automated stage and tilt of +70 to -70 degrees it is capable of electron tomography including various software pacjages. Double tilt holder allows easy diffraction work for multiple zone axis while the samples is in the microscope. HigH resolution CCD as well as side entry fast cameras, and Gatan GIF.

    Features & Accessories:

  22. Ultra Twin TEM

    Acceleration voltage = 200 kV.Spherical aberration coefficient (Cs) = 0.5mm.Chromatic aberration coefficient (Cc)= 1.0 mm. Point resolution = 0.19 nm. Side-entry computer controlled eucentric goniometer ( 20 and 15). EDS, and high resolution Gatan CCD camera..

  23. X-ray Photoelectron Spectrometer (XPS)

    The Thermo Scientific™ K-Alpha™+ X-ray Photoelectron Spectrometer (XPS) System is a fully integrated, monochromated small-spot XPS system with depth profiling capabilities. State-of-the-art performance, reduced cost of ownership, increased ease of use and compact size make the K-Alpha X-ray XPS System ideal for a multi-user environment.

  24. ZYGO Optical Profilometer

    The ZYGO white light interferometer (profilometer) is a tool for characterizing and quantifying surface roughness, step heights, critical dimensions, and other topographical features with excellent precision and accuracy. All measurements are nondestructive, fast, and require little to no sample preparation. Profile heights ranging from < 1 nm up to 20000 nm at high speeds, independent of surface texture, magnification, or feature height!