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Program Application

Polymer Characterization

Instrument

AFM-Bruker Dimension Icon; contact mode, tapping mode, peakforce tapping, PFQNM, MFM, PRM, EFM, PFKPFM, and SCM @ Materials Characterization Lab @ Center for Nanoscale Science
AFM-Dimension 3100; contact mode, tapping mode, and phase imaging @ Materials Characterization Lab @ Center for Nanoscale Science
ARES-G2 Rheometer @ Triangle MRSEC Soft Matter Lab @ Research Triangle MRSEC
Auxiliary Equipment @ The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
Bruker Hyperion FT-IR Spectrometer & Microscope @ Materials Cluster @ Cornell Center for Materials Research
ESEM-FEI Quanta 200 Environmental SEM; 10nm Resolution, BSE, EDS, and Temperature Control @ Materials Characterization Lab @ Center for Nanoscale Science
FESEM-FEI NanoSEM 630; 1.7nm Resolution, BSE, EDS, Beam Deceleration @ Materials Characterization Lab @ Center for Nanoscale Science
FTIR-Bruker Hyperion 3000 Microscope; Transmission, Specular Reflectance, ATR, and Relflection Absoprtion @ Materials Characterization Lab @ Center for Nanoscale Science
FTIR-Bruker IFS 66/S and Bruker Vertex V70; Near-IR/Mid-IR/Far-IR, Step Scan, Interchangeable Optical Components @ Materials Characterization Lab @ Center for Nanoscale Science
Instron @ Triangle MRSEC Soft Matter Lab @ Research Triangle MRSEC
Particle Sizing-Malvern Mastersizer "S"; Laser Diffraction for Coatings, Ceramics, Cosemetics, Cement, Food, and Clays @ Materials Characterization Lab @ Center for Nanoscale Science
Particle Sizing/Zeta Potential-Malvern Zetasizer ZS; Dynamic Light Scattering for Proteins, Polymers, Micelles, Carbohydrates, Nanoparticles, Colloidal Dispersions, and Emulsions @ Materials Characterization Lab @ Center for Nanoscale Science
Q-Sense E4 quartz crystal microbalance @ The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
Raman-WITec Confocal Raman @ Materials Characterization Lab @ Center for Nanoscale Science
Recycling Preparative GPC @ Materials Cluster @ Cornell Center for Materials Research
Rheometer - Advanced Rheometric Expansion System (ARES) @ The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
SAXS-Molecular Metrology SAXS @ Materials Characterization Lab @ Center for Nanoscale Science
Surface Area-Gemini 2360 Surface Area Analyer @ Materials Characterization Lab @ Center for Nanoscale Science
Surface Area-Micromeritics ASAP 2020 @ Materials Characterization Lab @ Center for Nanoscale Science
Surface Area-Micromeritics ASAP 2920 @ Materials Characterization Lab @ Center for Nanoscale Science
TA Instruments DHR3 Rheometer @ Materials Cluster @ Cornell Center for Materials Research
TA Instruments DMA Q800 Dynamic Mechanical Thermal Analysis (DMTA) @ Materials Cluster @ Cornell Center for Materials Research
TA Instruments Q400EM Thermomechanical Analysis (TMA) @ Materials Cluster @ Cornell Center for Materials Research
ThermoFisher Capillary Breakup Extensional Rheometer (CaBER) @ Materials Cluster @ Cornell Center for Materials Research
UV-VIS-NIR-Perkin-Elmer Lambda 950 UV-VIS NIR Spectrophometer @ Materials Characterization Lab @ Center for Nanoscale Science
Waters MALDI Micro MX (MALDI-TOF) @ Materials Cluster @ Cornell Center for Materials Research
XPS-Kratos Analytical Axiz Ultra @ Materials Characterization Lab @ Center for Nanoscale Science
XRD-Multiwire Laue; Back-Reflection Mode for Single Crystal Applications @ Materials Characterization Lab @ Center for Nanoscale Science
XRD-PANalytical Empryean; Reflection Mode for Powder/Bulk Applications @ Materials Characterization Lab @ Center for Nanoscale Science
XRD-PANalytical Xpert Pro MPD; Reflection Mode for Powder/Bulk/Thin Film Applications @ Materials Characterization Lab @ Center for Nanoscale Science
XRD-Phillips MRD; Reflection Mode for Bulk and Thin Film Applications @ Materials Characterization Lab @ Center for Nanoscale Science
XRD-Rigaku DMAX-Rapid II; Reflection or Transmission Mode for Powder/Bulk/Thin Film/Single Crystal Applications @ Materials Characterization Lab @ Center for Nanoscale Science

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