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Home » Microscopy (373) » Electron Microscopy (171)

SEM

People

Alexander E. Ribbe @ UMass Amherst Materials Research Science and Engineering Center
Denis Pelekhov @ Center for Emergent Materials
Eric Stach @ The Laboratory for Research on the Structure of Matter
Jerry Hunter @ Materials Research Science and Engineering Center on Structured Interfaces
Justin Jureller @ Chicago Materials Research Center
Mariena Silvestry Ramos @ Cornell Center for Materials Research
Mark Pfeifer @ Cornell Center for Materials Research
Mick Thomas @ Cornell Center for Materials Research
Paul Voyles @ Materials Research Science and Engineering Center on Structured Interfaces
Phil Carubia @ Cornell Center for Materials Research

Instrument

Amray 1860 FEG high resolution SEM @ Electron Microscopy Facilities @ Materials Research Science Engineering Center
Auxiliary Equipment @ The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
Carl Zeiss Merlin SEM @ Materials Preparation and Measurement Laboratory (MPML) @ Chicago Materials Research Center
Carl Zeiss Zigma VP FE SEM @ Electron Microscopy @ Center for Precision Assembly of Superstratic and Superatomic Solids
Cold Field Emission Gun Scanning Electron Microscope @ Characterization Facility (CharFac) @ UMN Materials Research Science and Engineering Center
Electron Backscatter Detector @ Electron Microscopy Cluster @ Cornell Center for Materials Research
ESEM-FEI Quanta 200 Environmental SEM; 10nm Resolution, BSE, EDS, and Temperature Control @ Materials Characterization Lab @ Center for Nanoscale Science
FEI 600 Quanta FEG ESEM @ Electron Microscopy Facility @ The Laboratory for Research on the Structure of Matter
FEI Helios Nanolab SEM/FIB @ Electron Probe Instrumentation Center (EPIC) @ Northwestern University Materials Research Science and Engineering Center
FEI Inspect S Electron Scanning Microscope w/ Cathodoluminescence System @ Microscopy and Microanalysis Facility @ Materials Research Laboratory: an NSF MRSEC
FEI Magellan 400 Scanning Electron Microscope @ Electron and Optical Microscopy @ UMass Amherst Materials Research Science and Engineering Center
FEI Nova NanoSEM 230 @ Materials Preparation and Measurement Laboratory (MPML) @ Chicago Materials Research Center
FEI Nova NanoSEM 450 @ Electron Nanoscopy Instrumentation @ UNL Materials Research Science and Engineering Center
FEI Quanta 200 FEG Environmental-SEM with EDS/EEL @ Imaging and Analysis Center @ Princeton Center for Complex Materials
FEI Quanta 200 Field Emission Environmental SEM @ Orientation Imaging Microscopy (OIM) @ Carnegie Mellon University MRSEC
FEI Quanta ESEM @ Electron Probe Instrumentation Center (EPIC) @ Northwestern University Materials Research Science and Engineering Center
FEI Verios 460 XHR SEM with EDS @ Imaging and Analysis Center @ Princeton Center for Complex Materials
FEI XL30 FEG-SEM @ Imaging and Analysis Center @ Princeton Center for Complex Materials
FEI XL30 Sirion FEG Digital Electron Scanning Microscope @ Microscopy and Microanalysis Facility @ Materials Research Laboratory: an NSF MRSEC
FEI XL40 SEM @ Imaging and Characterization Facility @ CRISP: Center for Research on Interface Structures and Phenomena
FEI XL40 Sirion FEG Digital Scanning Microscope w/EDS @ Microscopy and Microanalysis Facility @ Materials Research Laboratory: an NSF MRSEC
FESEM-FEI NanoSEM 630; 1.7nm Resolution, BSE, EDS, Beam Deceleration @ Materials Characterization Lab @ Center for Nanoscale Science
FIB-FEI Quanta 200 3D FIB; 3.5nm SEM Resolution, 10nm Ga+ Beam, Pt GIS, and Selective Carbon Etch GIS @ Materials Characterization Lab @ Center for Nanoscale Science
FIB-FEI Helios NanoLab 660; DualBeam SEM/FIB Platform-pushing the limits of extreme high resolution characterization in 2D an 3D, nanoprototyping, and sample preparation @ Materials Characterization Lab @ Center for Nanoscale Science
Field Emission Gun Scanning Electron Microscope @ Characterization Facility (CharFac) @ UMN Materials Research Science and Engineering Center
Gatan Tensile Stages @ Triangle MRSEC Soft Matter Lab @ Research Triangle MRSEC
Hitachi S-2700 @ Materials Preparation and Measurement Laboratory (MPML) @ Chicago Materials Research Center
Hitachi S-3400N-II @ Electron Probe Instrumentation Center (EPIC) @ Northwestern University Materials Research Science and Engineering Center
Hitachi S-4800-II @ Electron Probe Instrumentation Center (EPIC) @ Northwestern University Materials Research Science and Engineering Center
Hitachi SU-70 high resolution SEM @ Imaging and Characterization Facility @ CRISP: Center for Research on Interface Structures and Phenomena
Hitachi SU8030 @ Electron Probe Instrumentation Center (EPIC) @ Northwestern University Materials Research Science and Engineering Center
Hitachi Tabletop Scanning Electron Microscope @ SCSU (Southern Connecticut State University) @ CRISP: Center for Research on Interface Structures and Phenomena
JEOL 6700F Scanning Electron Microscope @ Electron Microscopy Facilities @ Materials Research Science Engineering Center
JEOL 7500F HRSEM @ Electron Microscopy Facility @ The Laboratory for Research on the Structure of Matter
JEOL JSM 845 SEM @ Central Facility for Electron Microscopy @ Center for Advanced Materials Research
JEOL JSM-6320 Scanning Electron Microscope @ Electron and Optical Microscopy @ UMass Amherst Materials Research Science and Engineering Center
JEOL SEM @ Minnesota Nano Center (MNC) @ UMN Materials Research Science and Engineering Center
Leica EM TiC 3X Ion Beam Milling System @ The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
LEO 1530 HRSEM @ Central Facility for Electron Microscopy @ Center for Advanced Materials Research
LEO 1550 FESEM @ The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
LEO Gemini 1525 @ Electron Probe Instrumentation Center (EPIC) @ Northwestern University Materials Research Science and Engineering Center
Nova 600 NovaLab Dual Beam Focused Ion Beam SEM @ Orientation Imaging Microscopy (OIM) @ Carnegie Mellon University MRSEC
Nova Nano FE SEM 450 with a NPGS @ Electron Microscopy @ Center for Precision Assembly of Superstratic and Superatomic Solids
Philips XL40 FEGSEM @ Orientation Imaging Microscopy (OIM) @ Carnegie Mellon University MRSEC
Tescan Mira3 FESEM @ Electron Microscopy Cluster @ Cornell Center for Materials Research
Tescan S8252G Raman - SEM/FIB @ Characterization Laboratory @ Renewable Energy Materials Research Science and Engineering Center
Zeiss Auriga Focused Ion Beam FIB/FESEM @ The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
Zeiss Gemini 300 FESEM @ The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
Zeiss Gemini 450 FESEM @ The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
Zeiss Gemini 500 SEM @ Electron Microscopy Cluster @ Cornell Center for Materials Research
Zeiss Leo 1530 FESEM/EDS/EBSD @ The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
Zeiss SEM and Electron Beam Lithography System @ Electron Microscopy Facilities @ Materials Research Science Engineering Center
Zeiss Sigma 500 SEM @ Electron Microscopy Cluster @ Cornell Center for Materials Research

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MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.