Skip to:

Skip to content
Skip to navigation

MRFN Member Login

Program Application

Structural Characterization

Instrument

AES-Physical Electronics 670; 50nm spatial resolution; in situ fracture stage @ Materials Characterization Lab @ Center for Nanoscale Science
Biological sample preparation and analysis services @ Materials Research Laboratory Central Research Facilities @ Illinois MRSEC
Center for Excellence in Soft Materials @ Materials Research Laboratory Central Research Facilities @ Illinois MRSEC
Contact mask alignment and photoresist exposure system @ Microfabrication Facility @ The Bioinspired Soft Materials Center
ESEM-FEI Quanta 200 Environmental SEM; 10nm Resolution, BSE, EDS, and Temperature Control @ Materials Characterization Lab @ Center for Nanoscale Science
FESEM-FEI NanoSEM 630; 1.7nm Resolution, BSE, EDS, Beam Deceleration @ Materials Characterization Lab @ Center for Nanoscale Science
FIB-FEI Quanta 200 3D FIB; 3.5nm SEM Resolution, 10nm Ga+ Beam, Pt GIS, and Selective Carbon Etch GIS @ Materials Characterization Lab @ Center for Nanoscale Science
FIB-FEI Helios NanoLab 660; DualBeam SEM/FIB Platform-pushing the limits of extreme high resolution characterization in 2D an 3D, nanoprototyping, and sample preparation @ Materials Characterization Lab @ Center for Nanoscale Science
Instron-Sacks Planar Biaxial Soft Tissue Testing System
MicroBionix Testing System
Optical Profilometer-ZYGO NewView 7300; Surface Topography, Coating Thickness, Step Height, and 3D Imaging @ Materials Characterization Lab @ Center for Nanoscale Science
Particle Sizing-Malvern Mastersizer "S"; Laser Diffraction for Coatings, Ceramics, Cosemetics, Cement, Food, and Clays @ Materials Characterization Lab @ Center for Nanoscale Science
Particle Sizing/Zeta Potential-Malvern Zetasizer ZS; Dynamic Light Scattering for Proteins, Polymers, Micelles, Carbohydrates, Nanoparticles, Colloidal Dispersions, and Emulsions @ Materials Characterization Lab @ Center for Nanoscale Science
Q-Sense E4 Quartz Crystal Microbalance (QCM-D) @ Spectroscopy Facility @ Materials Research Laboratory: an NSF MRSEC
Rheometer - Advanced Rheometric Expansion System (ARES) @ The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
RSA III Dynamic Mechanical Analyzer @ The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
SAXS-Molecular Metrology SAXS @ Materials Characterization Lab @ Center for Nanoscale Science
SAXS/WAXS/GISAXS @ Shared Materials Instrumentation Facility (SMIF) @ Research Triangle MRSEC
Surface Area-Gemini 2360 Surface Area Analyer @ Materials Characterization Lab @ Center for Nanoscale Science
Surface Area-Micromeritics ASAP 2020 @ Materials Characterization Lab @ Center for Nanoscale Science
Surface Area-Micromeritics ASAP 2920 @ Materials Characterization Lab @ Center for Nanoscale Science
TA Instruments DHR3 Rheometer @ Materials Cluster @ Cornell Center for Materials Research
TA Instruments DMA Q800 Dynamic Mechanical Thermal Analysis (DMTA) @ Materials Cluster @ Cornell Center for Materials Research
Viscolite 700HP Bench Viscometer @ Polymer Characterization Facility @ Materials Research Laboratory: an NSF MRSEC
XPS-Kratos Analytical Axiz Ultra @ Materials Characterization Lab @ Center for Nanoscale Science
XRD-Multiwire Laue; Back-Reflection Mode for Single Crystal Applications @ Materials Characterization Lab @ Center for Nanoscale Science
XRD-PANalytical Empryean; Reflection Mode for Powder/Bulk Applications @ Materials Characterization Lab @ Center for Nanoscale Science
XRD-PANalytical Xpert Pro MPD; Reflection Mode for Powder/Bulk/Thin Film Applications @ Materials Characterization Lab @ Center for Nanoscale Science
XRD-Phillips MRD; Reflection Mode for Bulk and Thin Film Applications @ Materials Characterization Lab @ Center for Nanoscale Science
XRD-Rigaku DMAX-Rapid II; Reflection or Transmission Mode for Powder/Bulk/Thin Film/Single Crystal Applications @ Materials Characterization Lab @ Center for Nanoscale Science
ZYGO 9000 Optical Profilometer @ The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces

People

Jerry Hunter @ Materials Research Science and Engineering Center on Structured Interfaces