Field Emission Gun Scanning Electron Microscope
- High resolution secondary electron imaging; backscatter electron imaging; energy dispersive spectroscopy; electron backscatter diffraction; and cathodoluminescence
- Thermally-assisted field-emission gun
- Accelerating voltage from 0.5 to 30 kV
- Lateral resolution of 1.5 nm
- Magnification ranges from 10 X to 400,000X
- Sample size: 50 x 125 x 125 mm
- Backscattered imaging at TV rates and low voltage using the Centaurus detector
- Chemical analysis of bulk samples with elements as low as sodium available using a Thermo-Noran Vantage system
- Cathodoluminescence analysis with a Gatan (Oxford) MonoCL 2 system
- Crystallographic analysis with an EBSD system from HKL allowing pattern indexing and texture mapping with Channel 5 software
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