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University of Massachusetts Amherst
UMass Amherst Materials Research Science and Engineering Center
Electron and Optical Microscopy
Facility Primary Contact:
Alexander E. Ribbe
Instrument Technical Primary Contact:
Alexander E. Ribbe
More details about this Instrument
JEOL 2200FS Energy Filtered Transmission Electron Microscope
Instrument types
Transmission Electron Microscopy
Make / Model :
JEOL JEM-2200FS
Schottky Thermal Field Emitter Source
In-Column Electron Energy Loss Filter for EELS and EFTEM
Scanning Transmission Electron Microscopy with HAADF
X-MAX Energy Dispersive X-ray Spectrometer
Cryo-Stage
Electron Tomography
Additional Information: Installation scheduled for early 2014
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