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Johns Hopkins University
Materials Research Science Engineering Center
Electron Microscopy Facilities
Instrument Technical Primary Contact:
Ken Livi
More details about this Instrument
300 keV HRTEM with FEG and GI
Instrument types
Transmission Electron Microscopy
Make / Model :
Philips CM300FEG TEM
FEATURES:
Electron Energy Loss Spectroscopy (EELS)
Chemical Imaging by energy filtering
2.0 Angstrom point to point resolution
Compoisitional Analysis by Dispersive X-Ray Spectroscopy
Scanning TEM
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