The JEOL 2010F TEM/STEM is a state-of-the-art field emission transmission electron microscope with capabilities ranging from nanobeam and convergent beam diffraction to high resolution phase contrast, analytical and energy filtered imaging. The 2010F has been optimized for analytical microscopy with a large solid angle for high X-ray throughput, scanning, scanning-transmission, and backscattered electron detectors and a Gatan image filter for energy filtered imaging and electron energy loss spectroscopy. This combination of analytical capabilities makes the 2010F an ideal instrument for the characterization of a wide array of samples, yet the 2010F is also a very capable high-resolution instrument with a point-to-point resolution of 0.23 nm.