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Brucker Dimension ICON SPM

Instrument types
Bruker Dimension Icon® Atomic Force Microscope is equipped with proprietary ScanAsyst® automatic image optimization technology, which enables easier, faster, and more consistent results.
Material Mapping:
Icon supports PeakForce QNM® Imaging Mode, enabling researchers to map and distinguish quantitatively between nanomechanical properties while simultaneously imaging sample topography at high resolution. This technology operates over an extremely wide range (1MPa to 50GPA for modulus and 10pN to 10μn for adhesion) to characterize a large variety of sample types.
Electrical Characterization:
Carry out electrical characterization at the nanoscale with greater sensitivity and dynamic range using exclusive PeakForce TUNA & PeakForce KPFM modules. Key capabilities:
• Conductivity mapping on the most delicate sample: charges, charge distribution, diffusions, surface potential distribution, etc; 
• Correlated quantitative nanomechanical properties (modulus & adhesion); 
•Information for rational nanostructure optimization --ID components & their distribution.
Perform manipulation, indentation, and lithography at the nanometer and molecular scales. The Icon’s XYZ closed-loop scanner provides precise probe positioning with no piezo creep and extremely low noise for the best positioning of any available nanomanipulation system.
Heating and Cooling
Execute temperature control and thermal analysis on samples from –35°C to 250°C while scanning in various AFM modes.