A 120kV TEM (Philips EM-400) is equipped with an an energy-dispersive X-ray spectrometer (Oxford INCA EDX) which enables high-spatial resolution elemental analysis of nanostructures. The system utilizes a thin-window light-element detector, and employs specialized software that enables comprehensive interactive tutorials and an informative library as a resource for teaching associated techniques. The TEM is also outfitted with a Gatan 794 CCD digital camera and analytical software (Digital Micrograph). This bottom-mounted camera and its associated software enable users to capture and analyze data from the TEM at its resolution limit (i.e. 0.3 nm). The TEM is used heavily in nano-scale investigations of interfaces and thin films.
|Detectors:||BSE: Backscatter electron detector|
|Accelerating Voltage||100kV - 120kV|