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This diffractometer can be used to collect XRPD, GIXD, XRR, and residual stress data. Some texture analysis is also possible. Sample sizes may be as large as 60mm diameter by 3-12mm thick, though a more typical sample size is 10-20mm diameter. Data collection modes can be changed between high-speed high-resolution divergent beam diffraction and parallel beam diffraction. There are several accessories for this instrument, including an X'Celerator position sensitive detector, a furnace for in-situ high temperature measurements, a cryostat for in-situ low temperature measurements, a diffracted beam monochromator, and a 15-position automatic sample changer.