The FEI Tecnai Osiris 200kV TEM is a new type of microscope specifically configured for material science. The Osiris is equipped with a new type of high-brightness electron source and a new high-area solid-angle x-ray detector, making possible real-time spectral imaging. Another type of spectral analysis is provided by an electron engergy-loss spectrometer. This new generation of electron microscope is operated from a remote console, making use of motorized apertures and high-resolution video cameras to keep human operators removed from the sensitive electron optics. In support of TEM sample preparation, the YINQE laboratory is also equipped with the latest generation of ion-beam thinning tools, in addition to our current FIB instrument.