Description:

This small-angle scattering beamline incorporates high-flux optics, in situ control of sample temperature, and an area detector.  The intense beam generated by this instrument makes it ideal for obtaining time-resolved measurements, such as crystallization behavior, phase transformation kinetics, and response to mechanical deformation.  Samples can be analyzed in many forms, including solutions, fibers, films, and powders.

Equipment:

• Rigaku 12kW rotating anode with Cu source and point focus.
• Frank Mirrors.
• Siemens Hi-Star multi-wire area detector.

Accessories:

Completely automated in situ control of sample temperature (-40° C to 200° C) with rapid (1° C/second) heating and cooling.

Applications:

• Structural analysis of microstructures including time-resolved measurements, such as crystallization behavior, phase transformation kinetics, and response to mechanical deformation.
• Study of oriented structures.
• Pore size distribution measurements.
• Measurement of dimensions and symmetries of microstructured materials (block copolymers, surfactant suspensions, zeolites, liquid crystals).
• Determination of radius of gyration of microspheres.
• Analysis of lamellar systems.
• Thin-film characterization.
• Study of microstructural aspects of mechanical deformation.

Capabilities:

Data can be taken over angles from 0.18 to 38 degrees (depending on detector setting) which corresponds to structural features from 0.25 to 50 nm.  Samples in many forms, including solutions, fibers, films, and powders, can be analyzed.

Specifications:

• Data can be taken over angles from 0.18 to 38 degrees.
• Solutions, fibers, films, and powders can be analyzed.
• Automated in situ control of sample temperature (-40° C to 200° C) with rapid (1° C/second) heating and cooling.
• Bruker-AXS Hi-Star multi-wire area detector.
• Rigaku 12kW rotating anode with Cu source and point focus.
• Frank mirrors.