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Atomic Content Characterization
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Mass/Density Characterization
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Microscopy
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--Transmission Electron Microscopy
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--Near Field Scanning Microwave Microscopy
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-Scanning Probe Microscopy
--Atomic Force Microscopy
--Scanning Tunneling Microscopy
Optical Characterization
-Ellipsometry
-Solar Simulator
-Optical Spectrometry
Polymer Characterization
-Circular Dichrosim
-Dynamic Light Scattering
-Gas Chromatography
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Profilometry
Structural Characterization
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Thermal Characterization
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Synthesis and Fabrication
-Crystal Growth
---MOCVD / MOVPE
---MBE
-Microwave Reactor
-Ovens
--Rapid Thermal Annealer
--Vacuum Ovens
-Thin Film Processing and Deposition
--Thin Film Deposition
---PECVD
---Pulsed Laser Deposition
--Microfabrication / Microelectronics / Clean Room
---Lithography
---Etching
---Wire Bonding
-Furnaces
-Polymer Processing
Spectroscopy
-InfraRed Reflection Absorption Spectroscopy (IRRAS)
-LEED/Auger Electron Spectroscopy
-Rutherford Backscattering Spectrometry
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-NMR - Nuclear Magnetic Resonance
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Synchrotron Beam Line
Center
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Brandeis University - The Bioinspired Soft Materials Center
Columbia University - Center for Precision Assembly of Superstratic and Superatomic Solids
Cornell University - Cornell Center for Materials Research
Harvard University - Harvard Materials Research Center
Northwestern University - Northwestern University Materials Research Science and Engineering Center
Ohio State University - Center for Emergent Materials
Pennsylvania State University - Center for Nanoscale Science
Princeton University - Princeton Center for Complex Materials
University of California at Santa Barbara - Materials Research Laboratory: an NSF MRSEC
University of California, Irvine - Center for Complex and Active Materials
University of California, San Diego - University of California, San Diego MRSEC
University of Chicago - Chicago Materials Research Center
University of Delaware - University of Delaware Center for Hybrid, Active, and Responsive Materials
University of Illinois at Urbana-Champaign - Illinois MRSEC
University of Michigan - Center for Materials Innovation
University of Minnesota - UMN Materials Research Science and Engineering Center
University of Pennsylvania - The Laboratory for Research on the Structure of Matter
University of Texas – Austin - Center for Dynamics and Control of Materials
University of Washington - Molecular Engineering Materials Center
University of Wisconsin-Madison - Materials Research Science and Engineering Center on Structured Interfaces
Brandeis University
The Bioinspired Soft Materials Center
Biologial Materials Facility
ÄKTA Pure liquid chromatography system
»
Gel Permeation Chromatography
ALV/DLS/SLS-5000 Light Scattering System
»
Dynamic Light Scattering
Cold room bench space
»
Synthesis and Fabrication
High-capacity and high-speed centrifuges
»
Synthesis and Fabrication
Stationary, shaking, and bioreactor type incubators
»
Synthesis and Fabrication
Computation Facility
Science-wide high performance computational cluster (HPCC)
»
Computing / Simulation
Light Microscopy Facility
Multi wavelength TIRF microscope
»
Electron Microscopy
Microfabrication Facility
Contact mask alignment and photoresist exposure system
»
Structural Characterization
Brown University
Center for Advanced Materials Research
Central Facility for Electron Microscopy
FEI Helios Dual Beam FIB with an Omniprobe nanomanipulator and autoTEM sample preparation
»
Focused Ion Beam
JEOL JEM-2010 TEM
»
Transmission Electron Microscopy
JEOL JSM 845 SEM
»
SEM
LEO 1530 HRSEM
»
SEM
Phillips EM-420 TEM/STEM
»
Transmission Electron Microscopy
Central Facility for Microelectronics
PlasmaTherm RIE/PECVD System
»
Thin Film Deposition
Annealing Furnace
»
Furnaces
Cary 500 Spectrophotometer
»
Optical Spectrometry
Cee Model 100 Photoresist Spinner
»
Lithography
Dektak Profilometer
»
Profilometry
Dopant Furnace
»
Furnaces
Electron Beam Evaporator
»
Thin Film Deposition
HVEC Thermal Evaporator
»
Thin Film Deposition
Karl Suss MJB-3 Mask Aligner
»
Lithography
LPCVD (Low-pressure Chemical Vapor Deposition)
»
Thin Film Deposition
Oxford Instruments Ion-beam Deposition Tool
»
Thin Film Deposition
Plasma Etching - Trion (Chlorine-chemistry) RIE Tools
»
Etching
Plasmatherm RIE/PECVD System (Fluorine-chemistry)
»
Etching
Rudolph Ellipsometer
»
Thin Film Deposition
Three-target Magnetron Sputtering System
»
Thin Film Deposition
Wedge Bonder
»
Wire Bonding
Wet and Dry Oxide Furnace
»
Furnaces
Wet Chemistry Hoods
»
Lithography
Carnegie Mellon University
Carnegie Mellon University MRSEC
Orientation Imaging Microscopy (OIM)
FEI Quanta 200 Field Emission Environmental SEM
»
SEM
Nova 600 NovaLab Dual Beam Focused Ion Beam SEM
»
SEM
Philips XL40 FEGSEM
»
SEM
Scanning Auger Electron Microscopy Laboratory
PHI Model 600 SAM
»
Spectroscopy
Surface Preparation and Characterization Laboratory
Diamond Milling System
Logitec Lapping and Polishing System
»
Thin Film Processing and Deposition
Spindle Polishing Machine
ThermoMicroscopes M5
»
Optical Microscopy
,
Atomic Force Microscopy
Colorado School of Mines
Renewable Energy Materials Research Science and Engineering Center
Atom Probe Tomography Laboratory
Cameca LEAP 4000 XSi
»
Atom probe
Dynamic Atom Probe
»
Atom probe
Characterization Laboratory
IV16L Solar Simulator
»
Solar Simulator
Tescan S8252G Raman - SEM/FIB
»
Focused Ion Beam
,
SEM
,
FTIR/Raman Spectroscopy
Chemical Vapor Deposition Laboratory
PECVD Cluster Tool
»
PECVD
Si Nanoparticle Reactor
Cleanroom and Processing Laboratory
Denton Thermal Evaporation Chamber
»
Thin Film Deposition
Four-Point Probe
»
Thin Film Deposition
Gaertner Ellipsometer
»
Thin Film Deposition
Lindberg/Blue Oven
»
Furnaces
March Reactive Ion Etcher
»
Etching
Probe Station
SCS G3P-8 Spin Coater
»
Thin Film Deposition
ULVAC-RIKO MILA-5000 Rapid Thermal Processor
»
Furnaces
Synthesis Laboratory
Glove Box
»
Microfabrication / Microelectronics / Clean Room
Thin Film Processing Lab
AJA Evaporation Chamber
»
Thin Film Deposition
AJA Orion Sputter Chamber
»
Thin Film Deposition
Cary 5G Spectrophotometer
»
Spectroscopy
Glass Cutting Board
»
Microfabrication / Microelectronics / Clean Room
Jelight Model 42 UVO-Cleaner
»
Microfabrication / Microelectronics / Clean Room
Mellen S5-211-3 Tube Furnace
»
Furnaces
Nicolet 6700 FT-IR Spectrometer
»
Spectroscopy
Semicore Reactive Ion Etcher
Semicore Sputter System
»
Thin Film Deposition
Sentech SENDIRA FT-IR Ellipsometer
»
Thin Film Deposition
Tencor P10 Profilometer
Wet Chemical Etching
Columbia University
Center for Precision Assembly of Superstratic and Superatomic Solids
Electron Microscopy
Carl Zeiss Zigma VP FE SEM
»
SEM
FEI Talos F200X Transmission/Scanning Transmission Electron Microscope (S/TEM)
»
Transmission Electron Microscopy
,
STEM
Light Zeiss Axioscope A1
»
Optical Microscopy
Nova Nano FE SEM 450 with a NPGS
»
SEM
Shared Materials Characterization Laboratory (SMCL)
Agilent 8453 UV/Vis Spectrophotometer
»
Optical Spectrometry
Agilent SuperNova SCXRD
»
X-ray Diffraction
Bruker Dimension AFM
»
Atomic Force Microscopy
Cryogenic R-700X SQUID Magnetometer
»
SQUID Magnetometry
Glove box 2D materials stacking station
»
Synthesis and Fabrication
Malvern Zetasizer Nano-ZS
»
Dynamic Light Scattering
PANalytical XPert3 Powder XRD
»
X-ray Diffraction
Phi 5500, XPS
»
XPS
Renishaw inVia micro-Raman spectrometer
»
FTIR/Raman Spectroscopy
TA Instruments Q500 TGA
»
Thermo-Gravimetric Analysis
Woollam Alpha-SE Ellipsometer
»
Ellipsometry
Cornell University
Cornell Center for Materials Research
Electron Microscopy Cluster
Allied Multiprep polishers
»
Electron Microscopy
Electron Backscatter Detector
»
SEM
FEI Strata 400 STEM FIB
»
Focused Ion Beam
,
STEM
FEI Tecnai 12 Bio-Twin TEM
»
Transmission Electron Microscopy
FEI Titan Cryo-S/TEM 300kV
»
Electron Microscopy
,
Transmission Electron Microscopy
,
STEM
Fischione 1010 Ion mill
»
Electron Microscopy
Leica EM UC7/FC7 Cryoultramicrotome
»
Electron Microscopy
Leica Ultracut UCT Ultramicrotome
»
Electron Microscopy
Olympus BX51 W1F
»
Optical Microscopy
Olympus BX51 with crossed polarization
»
Optical Microscopy
Tescan Mira3 FESEM
»
SEM
Thermo Fisher Arctica 200kV S/TEM
»
Transmission Electron Microscopy
,
STEM
Thermo Fisher Helios G4 UX Focused Ion Beam
»
Focused Ion Beam
Thermo Fisher Perseus 60-300kV S/TEM
»
Transmission Electron Microscopy
,
STEM
Thermo Fisher Spectra 300 30-300kV Kraken & Andromeda STEMs
»
Transmission Electron Microscopy
,
STEM
Zeiss Gemini 500 SEM
»
SEM
Zeiss Sigma 500 SEM
»
SEM
Materials Cluster
3i Marianas Spinning Disk Confocal Microscope
»
Optical Microscopy
,
Confocal Fluorescence Microscopy
Air Furnaces
»
Furnaces
Asylum-MFP3D-Bio-AFM-SPM
»
Electrical Characterization
,
Magnetic Characterization
,
Optical Microscopy
,
Atomic Force Microscopy
ATM Sonic sifter
»
Thermal Characterization
Bruker D8 Advance ECO Powder Diffractometer
»
X-ray Diffraction
Bruker General Area Detector Diffraction System (GADDS)
»
X-ray Diffraction
Bruker Hyperion FT-IR Spectrometer & Microscope
»
Microscopy
,
Optical Microscopy
,
Polymer Characterization
,
Spectroscopy
,
FTIR/Raman Spectroscopy
Bruker Vertex V80V Vacuum FTIR system
»
Optical Spectrometry
,
FTIR/Raman Spectroscopy
Carver 25 ton press
»
Microscopy
Cary 5000 UV-Vis-NIR Spectrophotometer
»
Optical Spectrometry
Cascade Four-Point Probe
»
Electrical Characterization
Controlled Atmosphere Furnaces
»
Furnaces
Edinburgh FLS1000 Lifetime Fluorescence Spectrometer
»
Optical Microscopy
,
Confocal Fluorescence Microscopy
,
Optical Characterization
,
Optical Spectrometry
Glass Bead Abrasive Units (sand blasting)
»
Synthesis and Fabrication
High Vacuum Furnaces
»
Furnaces
Inert Gas Glove Boxes
»
Synthesis and Fabrication
JAI-LC9110NEXT-Recycling-Preparative-HPLC
»
Gel Permeation Chromatography
Jasco 1500 Circular Dichroism Spectrometer
»
Circular Dichrosim
Keyence VK-X260 Laser-Scanning Confocal Microscope
»
Profilometry
KJL Magnetron Sputtering Tool
»
Thin Film Deposition
KSV-NIMA-KN2002-Langmuir-Blodgett-Trough
»
Synthesis and Fabrication
,
Thin Film Processing and Deposition
,
Thin Film Deposition
KSV-NIMA-KN4010-Dip-Coater
»
Synthesis and Fabrication
,
Thin Film Processing and Deposition
,
Thin Film Deposition
Laurell-WS-400A-Spin-Coater
»
Thin Film Deposition
,
Polymer Processing
Multiwire Back-Reflection Laue Detector
»
X-ray Diffraction
PPMS Physical Property Measurement Systems
»
PPMS
,
Magnetic Characterization
,
Thermal Characterization
Quantum Design MPMS3 SQUID Magnetometer
»
SQUID Magnetometry
Recycling Preparative GPC
»
Polymer Characterization
Renishaw InVia Confocal Raman microscope
»
Microscopy
,
Optical Microscopy
,
Confocal Fluorescence Microscopy
,
Spectroscopy
,
FTIR/Raman Spectroscopy
Rigaku SmartLab X-Ray Diffractometer
»
X-ray Diffraction
Sputtering Deposition System
»
Thin Film Deposition
Stationary Spot Welder (Hughes HRW250B)
»
Synthesis and Fabrication
Struers Rotopol
»
STEM
TA Instruments DHR3 Rheometer
»
Polymer Characterization
,
Structural Characterization
,
Dynamical Mechanical Analysis
,
Rheometry
TA Instruments DMA Q800 Dynamic Mechanical Thermal Analysis (DMTA)
»
Polymer Characterization
,
Structural Characterization
,
Dynamical Mechanical Analysis
TA Instruments Q1000 Modulated Differential Scanning Calorimeter (MDSC)
»
Calorimetry
TA Instruments Q400EM Thermomechanical Analysis (TMA)
»
Polymer Characterization
TA Instruments Q500 Thermogravimetric Analyzer (TGA)
»
Thermo-Gravimetric Analysis
Tencor Alpha step 500
»
Profilometry
ThermoFisher Capillary Breakup Extensional Rheometer (CaBER)
»
Polymer Characterization
,
Dynamical Mechanical Analysis
Varian Thermal Bell Jar Evaporator
»
Thin Film Deposition
Waters Ambient-Temperature GPC
»
Polymer Processing
Waters Ambient-Temperature-Aqueous GPC
»
Gel Permeation Chromatography
Waters Breeze DMSO GPC
»
Gel Permeation Chromatography
Waters MALDI Micro MX (MALDI-TOF)
»
Polymer Characterization
Wire Bonders
»
Wire Bonding
Witec Alpha300R Confocal Raman Microscope
»
FTIR/Raman Spectroscopy
X-ray photoelectron spectroscopy. Scienta Omicron ESCA2SR, SSX-100
»
XPS
Duke University - NC State University - UNC Chapel Hill - NCCU
Research Triangle MRSEC
Analytical Instrumentation Facility (AIF)
Bruker Dimension 3000 and MultiMode
FEI Quanta 3D FEG
FEI Titan 80-300
FEI Verios extreme-resolution SEM
»
Electron Microscopy
Hitachi S3200N
Hysitron Ubi-1 Nanoidenter
»
Scanning Probe Microscopy
ION TOF TOF-SIMS 5
JEOL 2000FX
JEOL 2010F
Leica UC7
Panalytical Empyrean
PECS System with PHOIBOS 150 Analyzer
Rigaku Smartlab XRD
Center for Biomanufacturing Research Institute & Technology Enterprise (BRITE)
Q-TOF Mass Spectrometer
500 MHz NMR Varian Unity INOVA
LC/MS (multiple units) Agilent 1200
Raman / AFM System
»
Scanning Probe Microscopy
Chapel Hill Analytical and Nanofabrication Laboratory (CHANL)
DRIE (Alcatel AMS)
Electron Beam Evaporator
ESEM
FIB (FEI Helios 600 Nanolab Dual Beam System)
Hot Embosser (JenOptik HX03)
Laser Ablation
Mask Aligner
Metal Sputtering
Oxygen Plasma System
PECVD
PLD (PVD Products Nano-PLD-1000 Pulsed Laser Deposition System)
SEM (Hitachi S-4700 Cold Cathode Field Emission Scanning Electron Microscope)
Stylus Profiler: KLA Tencor P-6
Thin-Film Mapper: Filmetrics F50
Ultramicrotome
Computer Integrated Systems for Microscopy and Manipulation (CISMM)
3DFM (3D Force Microscope)
MHTS (Magnetic High Throughput System)
NanoManipulator
Nanofabrication Facility (NNF)
Alcatel AMS 100
ASML 193 nm PAS 5500 950B Step and Scan System
DC Sputtering System
GCA 8500DSW Stepper
Headway Spinner: Photoresist Spinner
Karl Suss MJB3 Mask Aligner &Karl Suss MA 6 Mask Aligner
Kurt Lesker Electron Beam Evaporation System & 4" (Old) Electron Beam Evaporation System
Laurell Spinner: Photoresist Spinner
LPCVD
Nano eNabler
Nanometrics Nanospec/AFT
Obducat NIL-2.5 Nanoimprinter
Plasma Therm
PM-600: Plasma Asher
RAITH 150 TWO E-BEAM WRITER
Resistive Heated Evaporation
RF Magnetron Sputtering
Semi Group RIE
Solarex
SVG 90-SE develop track
Trion
UHV-RTCVD System
Veeco Dektak 150 Profilometer
Woollam VASE (Variable Angle Spectroscopic Ellipsometer)
Shared Materials Instrumentation Facility (SMIF)
Bake Oven
»
Ovens
DC Sputter System
»
Thin Film Deposition
Digital Hot Plate
»
Synthesis and Fabrication
Digital Instruments Scanning Probe Microscope
»
Scanning Probe Microscopy
Dry Oxidation
»
Furnaces
E-beam & Thermal Metal Evaporator
»
Thin Film Deposition
E-Beam Lithography System
»
Lithography
E-Beam Metal Evaporator
»
Thin Film Deposition
Ellipsometer
»
Optical Spectrometry
Film Thickness Measurement System
»
Optical Characterization
Flip Chip Bonder
»
Wire Bonding
Fluorescence Microscope with Camera
»
Optical Microscopy
Frontside/Backside Mask Aligner
»
Lithography
Glove Box
»
Microfabrication / Microelectronics / Clean Room
High Temperature Anneal N-type doping
»
Furnaces
Hydrogen anneal
»
Furnaces
III-V Reactive Ion Etcher
»
Etching
Kratos X-Ray Photoelectron Spectrometer
»
XPS
LabRam Raman/PL Microscope
»
FTIR/Raman Spectroscopy
Low Temp Anneal and High Temp Anneal for P-type doping
»
Furnaces
Manual Microscope with Camera
»
Optical Microscopy
Mask Aligner
»
Lithography
Nicolet FT-IR Spectrometer
»
FTIR/Raman Spectroscopy
Nomarski Microsope with Camera
»
Optical Microscopy
Oxide/Nitride/Polymer Reactive Ion Etcher
»
Etching
PDMS Oven
»
Ovens
Plasma Asher
»
Etching
Plasma Enhanced Chemical Vapor Deposition System
»
Thin Film Deposition
Probe Station
»
Electron Microscopy
Profilometer
»
Profilometry
Rapid Thermal Anneal System
»
Furnaces
RF Dielectric Sputter System
»
Thin Film Deposition
SAXS/WAXS/GISAXS
»
Structural Characterization
Silicon Deep Reactive Ion Etcher
»
Etching
Vacuum Bake Oven
»
Ovens
X-Ray Diffractometer
»
X-ray Diffraction
Small Molecule Synthesis Facility (SMSF)
Agilent 1200 (prep HPLC)
Agilent 1200/6310
CEM Explorer
Teledyne/Isco CombiFlash Rf (purification system)
Triangle MRSEC Soft Matter Lab
ARES-G2 Rheometer
»
Polymer Characterization
Asylum Research Molecular Force Probe 3D atomic force microscope
»
Microscopy
Atomic absorption spectrometer
Biacore X
Cary 300 UV-Vis spectrometer
»
Spectroscopy
Cary-Varian 6000i UV-VIS-IR spectrometer
Electric Characterization
»
Electrical Characterization
Fisher Scientific Sonic Dismembrator
Gatan Tensile Stages
»
SEM
HunterLab UltraScan Vis
IBM Blade Center Linux cluster
»
Computing / Simulation
Instron
»
Polymer Characterization
Interferometric lithography
»
Synthesis and Fabrication
Izon Q Nano particle analyzer
Meiji Techno Metallurgical Microscope System
»
Microscopy
New Brunswick Excella E25 shaker-incubator
Olympus BXiS Upright Microscope
»
Microscopy
Plasma Cleaner
Sorvall centrifuge RC 3B plus
Sorvall centrifuge RC 5B plus
Sorvall centrifuge RC 5C plus
TA Instruments Nano-DSC differential scanning calorimeter
»
Thermal Characterization
ThermoScientific Artic thermocycler
UVP Gel max imager
Wire Exploder
Georgia Institute of Technology
GT Laboratory for New Electronic Materials
Physics NanoFab Facility
Horiba Jobinyvon Ellipsometer
Raman System
UHV Characterization & Growth System
»
Spectroscopy
Johns Hopkins University
Materials Research Science Engineering Center
Electron Microscopy Facilities
300 keV HRTEM with FEG and GI
»
Transmission Electron Microscopy
Amray 1860 FEG high resolution SEM
»
SEM
JEOL 6700F Scanning Electron Microscope
»
SEM
JEOL 8600 Electron Microprobe
»
Electron Microscopy
Philips 420T TEM
»
Transmission Electron Microscopy
Zeiss SEM and Electron Beam Lithography System
»
SEM
Fabrication and Processing
Class 1000 Cleanroom
»
Microfabrication / Microelectronics / Clean Room
Dual-Source Thermal Evaporators
Electron-Beam Lithography
»
Lithography
FEI Nova 600 Dual-Beam Focused Ion Beam System
»
Focused Ion Beam
Irraditation Chamber for Nuclear Particle Tracks
Kulicke & Soffa 4523 Wire Bonder
»
Wire Bonding
Lambda-Physik Pulsed Laser Deposition System
»
Pulsed Laser Deposition
Lindberg/Blue Tri-Arc Furnace
»
Furnaces
Mask Aligner
»
Lithography
Multilayer Electrochemical Deposition System
»
Thin Film Processing and Deposition
Multiple-Source Supttering Chambers
»
Thin Film Deposition
Projection Photolithography
»
Lithography
Tubular Furnaces (up to 1500 C)
»
Furnaces
Measurement of Physical Properties
Andreev Reflection Spectroscopy
»
Spectroscopy
Anton Paar MHT4 Ultramicrohardness System
Magneto-Transport Measurement System
»
Magnetic Characterization
Nanoindenter XP-Mechanical Properties Microprobe
Oxford 200 Top-Loading Dilution Refrigerator with 9 T Magnet
»
Magnetic Characterization
Perkin Elmer DSC2 and DSC7 Calorimeters
»
Calorimetry
Quantum Design MPMS SQUID Magnetometer
»
SQUID Magnetometry
RMC Helium-3 Cryostat
Shimadzu UV-2101 UV-VIS Spectrometer
»
Spectroscopy
Vector Vibrating Sample Magnetometer
»
Magnetic Characterization
Surface Characterization Facilities
AFM/MFM
»
Atomic Force Microscopy
Molecular Image Picoscan AFM
»
Atomic Force Microscopy
STM Tip Etching and Coating
»
Scanning Tunneling Microscopy
Tencor Thin Film Profilometer
»
Profilometry
Topometrix Discoverer STM and AFM
»
Scanning Probe Microscopy
X-Ray Photoelectron Spectrometer
X-Ray Characterization
Philips 3720 X-Ray Diffraction System
»
X-ray Diffraction
Philips X'Pert MRD Diffractometer
X-Ray Photoelectron Spectrometer
»
XPS
Massachusetts Institute of Technology
Center for Materials Science and Engineering
Electron Microscopy SEF
FEI Tecnai Multipurpose TEM
FEI/Philips XL30 FEG ESEM
Helios Nanolab 600 Dual Beam Focused Ion Beam Milling System (FIB)
JEOL 2010 Advanced High Performance TEM
JEOL 2010 FEG Analytical Electron Microscope
JEOL 2011 High Contrast Digital TEM
JEOL 5910 General Purpose SEM
Zeiss Merlin High-resolution SEM
Materials Analysis SEF
Cary 500i UV-Vis-NIR Dual-Beam Spectrophotometer
Filmetrics Reflectometer
Gaertner Scientific 3 Wavelength Variable Angle Ellipsometer
Harrick Scientific PDC-32G Plasma Cleaner
Kaiser Optical Hololab 5000R Raman Microscope
Linkum Scientific FTIR 600 Freezing/Hot stage
Mettler FP900 Thermosystem Hot stage
Oriel Instaspec II UV-Vis Spectrograph with Photo Diode Array Detector
Oxford Instruments Liquid Helium Cryostat
Perkin Elmer Pyris 1 Differential Scanning Calorimeter
Physical Electronics Model 700 Scanning Auger Nanoprobe
Physical Electronics Versaprobe II X-ray Photoelectron Spectrometer
Sopra Spectroscopic Ellipsometer
Tencor FLX 2320 Thin Film Stress Measurement System
Tencor P-16 Surface Profilometer
Thermo Fisher Continuum Fourier Transform Infrared Microscope
Thermo Fisher FTIR6700 Fourier Transform Infrared Spectrometer
Veeco Metrology Nanoscope IV Scanned Probe Microscope Controller with Dimension 3100 SPM
Veeco Metrology Nanoscope V Scanned Probe Microscope Controller with Dimension 3100 SPM, Hybrid Scanner, and Electrical Characterization Application Modules
Veeco/Digital Instruments MultiMode SPM
Veeco/Digital Instruments Nanoscope IIIa Scanned Probe Microscope Controller with Dimension 3000 SPM
X-ray Diffraction SEF
BACK REFLECTION LAUE DIFFRACTOMETER
Bede Triple Axis Diffractometer
BRUKER D8 GADDS MULTIPURPOSE DIFFRACTOMETER
BRUKER D8 HIGH RESOLUTION DIFFRACTOMETER
Bruker D8 Multipurpose Diffractometer
»
X-ray Diffraction
Bruker Single Crystal Diffractometer
»
X-ray Diffraction
Bruker Small Angle Diffractometer
»
X-ray Diffraction
BRUKER TRACER-III SD PORTABLE XRF UNIT
Horiba Jobin Yvon, ICP-AES
»
Spectroscopy
PANalytical Multipurpose Diffractometer
»
X-ray Diffraction
PANALYTICAL MULTIPURPOSE DIFFRACTOMETER
Quantum Design Inc. Magnetic Property Measurement Systems (MPMS-5S)
»
Magnetic Characterization
,
SQUID Magnetometry
,
Thermal Characterization
Quantum Design Inc. Magnetic Property Measurement Systems (MPMS-XL)
»
Magnetic Characterization
,
SQUID Magnetometry
Quantum Design Magnetic Property Measurement System (MPMS VSM)
»
SQUID Magnetometry
RIGAKU H3R SOURCE/BRUKER NANOSTAR SAXS SYSTEM
Rigaku Powder Diffractometers
»
X-ray Diffraction
RIGAKU RU-300 POWDER DIFFRACTOMETER
RIGAKU SMARTLAB MULTIPURPOSE DIFFRACTOMETER
New York University
NYU Materials Research Science and Engineering Center
Molecular Design Institute
Agilent 1200 Series HPLC/GPC
»
Gel Permeation Chromatography
Asylum MFP-3D-SA Atomic Force Microscope
»
Atomic Force Microscopy
CEM Discover Microwave System
Contact Angle Meter
Dimension 3100 Atomic Force Microscope
»
Atomic Force Microscopy
Dry Box
»
Microfabrication / Microelectronics / Clean Room
Electrochemical Quartz Crystal Microbalance
»
Electrical Characterization
Gas Chromatograph
»
Gas Chromatography
High Vacuum Coating System
»
Thin Film Processing and Deposition
Hydrogenerator
IR (Magna)
IR (Perkin-Elmer)
Langmuir-Blodgett Troughs
MBraun Labmaster 130 Glove Box
MDI Cleanroom
»
Microfabrication / Microelectronics / Clean Room
Multi-Mode Atomic Force Microscope
»
Atomic Force Microscopy
Optical Microscopes
»
Optical Characterization
PerkinElmer Pyris1 Differential Scanning Calorimetry
»
Calorimetry
PerkinElmer Pyris1 Thermogravimetric Analyzer
»
Thermo-Gravimetric Analysis
Polymer-Pen Lithography with XE Series AFM
»
Lithography
Shimadzu Analytical/Preparative HPLC/GPC
»
Gel Permeation Chromatography
Shimadzu GC-17A Gas Chromatograph
»
Gas Chromatography
Shimadzu HPLC/GPC
»
Gel Permeation Chromatography
UV-Vis
»
Spectroscopy
Vacuum Pumps
Water Purification System
X-Ray Diffractometer
Northwestern University
Northwestern University Materials Research Science and Engineering Center
Center for Atom Probe Tomography (NUCAPT)
8 TB data server
Arc Melter
ESKPLA
Five individual high-end PC workstations
Ion-beam sputter system (IBS/e) manufactured by South Bay Technologies
LEAP 4000XSI manufactured by Imago Scientific Instruments, Madison, Wisconsin
»
Atom probe
Microway AMD Quad-core Opteron cluster
Specimen preparation laboratory
Workstation for Thermocalc, DICTra and MedeA simulations
Central Laboratory for Materials Mechanical Properties (CLaMMP)
Crack opening displacement gages
Fatigue machine, equipped with a Centorr high temperature (1100C) environmental chamber.
Five MTS machines (three servo-hydraulic, one servo-electric, and one screw driven tensile machine)
Laser extensometer crack opening displacement gages
Metallurgical microscope
Three ATS constant load creep apparatus
Electron Probe Instrumentation Center (EPIC)
FEI Helios Nanolab SEM/FIB
»
SEM
FEI Quanta ESEM
»
SEM
Hitachi H-8100 TEM
»
Transmission Electron Microscopy
Hitachi HD-2300A STEM
»
STEM
Hitachi S-3400N-II
»
SEM
Hitachi S-4800-II
»
SEM
Hitachi SU8030
»
SEM
JEOL JEM-2100F Fast TEM
»
Transmission Electron Microscopy
LEO Gemini 1525
»
SEM
High Resolution Electron Microscopy and Surface Structure Facility
Linux Clusters
MIBE
SINBAD
SPEAR
UHV-HREM
Jerome B. Cohen X-ray Diffraction Facility
12 kW Cu Rigaku
18 kW Cu Rigaku
18 kW Mo Rigaku
Blake High-Resolution tangential goniometer
PC data analysis workstation
Rigaku ATX-G Thin-film Diffraction Workstation
Rigaku Dmax
Rigaku S-MAX 3000 High Brilliance SAXS-WAXS System
Rigaku SmartLab Thin-film Diffraction Workstation
Rigaku Ultima IV
Scintag XDS2000
Magnet, Low Temperature, and Optical Facility
Andor 303 mm focal length Czerny-Turner spectrograph
Computer-controlled Quantum Design Physical Properties Measurement System (PPMS)
DU420A-BEX2-DD thermoelectric cooled camera
EKSPLA PL2143SS
Lakeshore AC susceptometer
Quantum Design Magnetometer (MPMS5)
Materials Processing Microfabrication Cleanroom
Annealing Tube Furnace
Atomic Layer Deposition (ALD)
Chemical Hoods
Convection Ovens
Digital Baking Plates
Edwards Auto 306 e-beam Evaporator
Edwards Auto 500 FL400 e-beam Evaporator
Filmetrics F-20 Thin Film Analyzer
Hall Effect Measurements
Headway Spinners-Programmable
Kulicke & Soffa 4524D Ball-Ball Wire Bonder
Metricon 2010 Prism Coupler
Microscope
Nanomaster NPE4000 Plasma Enhanced Chemical Vapor Deposition (PECVD)
Omano Microscope
Oxford Instruments P 80 Plasma Enhanced Chemical Vapor Deposition(PECVD)
Oxford Instruments P 80 Reactive Ion Etcher (RIE)
Photolithography Wet Bench
Quintel Q-2000 Mask Aligner
Quintel Q-4000 Mask Aligner (0.5 m)
Rapid Thermal Processor
Samco RIE-10NR Reactive Ion Etcher (RIE)
SUSS MicroTek MABA6 Mask Aligner
Tencore P-10 Surface Profiler
West Bond 7374E Wedge-Wedge Wire Bonder
Optical Microscopy Metallography Facility
"Digital" darkroom
A semi-automatic Buehler Ecomet IV Abrasive and Polishing System
Alumina slurry polishing
Micro-hardness tester
Optical microscopes ranging from 6X to 1600X
Various 8" diameter platens
Surface Science Facility
Nanoindentors
PHI 590A Scanning Auger Microprobe
VG ESCA/SIMS system
Ohio State University
Center for Emergent Materials
NanoSystems Laboratory (NSL)
Bruker AXS Dimension Icon Atomic/Magnetic Force Microscope with ScanAsyst
»
Atomic Force Microscopy
Bruker D8 Discover High-Resolution Triple Axis X-Ray Diffractometer
»
X-ray Diffraction
FEI Helios Nanolab 600 Dual Beam Focused Ion Beam/Scanning Electron Microscope
»
Focused Ion Beam
Kurt J. Lesker Co. Lab 18 Thin Film Deposition System
»
Thin Film Deposition
Laurell WS-400B-6NPP-Lite Spinner
Minilock Phantom ICP RIE by Trion Technology
»
Etching
Quantum Design 14 T Physical Properties Measurement System with cryogenic AFM/MFM
»
PPMS
Quantum Design MPMS 3 Squid Magnetometer
»
SQUID Magnetometry
Seki Technotron Corp. AX5200M 1.5kW Microwave-Plasma Enhanced-Chemical Vapor Deposition system
West Bond SZ51 Wire Bonder
»
Wire Bonding
Pennsylvania State University
Center for Nanoscale Science
Central Facilities Laboratory
Fluorescence Optical Microscope and Optical Tweezers
»
Optical Characterization
Infrared Raman
»
Optical Characterization
Leiden 3He-4He Dilution Refrigerator
»
Thermal Characterization
Metallic Nanowires and Porous Alumina Membrane Synthesis System
»
Synthesis and Fabrication
Nanomechanical Characterization System
»
Optical Characterization
Near-field Scanning Optical Microscope (NSOM)
»
Optical Characterization
Quantum Design Model 6000 Physical Property Measurement System
»
Thermal Characterization
Thermal Evaporator
»
Synthesis and Fabrication
UV Laser Materials Processing Workstation
»
Optical Characterization
Materials Characterization Lab
AES-Physical Electronics 670; 50nm spatial resolution; in situ fracture stage
»
Atomic Content Characterization
,
Electron Microscopy
,
Structural Characterization
,
Spectroscopy
,
LEED/Auger Electron Spectroscopy
AFM-Bruker Dimension Icon; contact mode, tapping mode, peakforce tapping, PFQNM, MFM, PRM, EFM, PFKPFM, and SCM
»
Electrical Characterization
,
Magnetic Characterization
,
Microscopy
,
Image Analysis and Processing
,
Scanning Probe Microscopy
,
Polymer Characterization
AFM-Dimension 3100; contact mode, tapping mode, and phase imaging
»
Microscopy
,
Image Analysis and Processing
,
Scanning Probe Microscopy
,
Polymer Characterization
Electrical Characterization-Impedance/Current/Resistance Measuremnets, PE and Strain, Breakdown, Poling Samples
»
Electrical Characterization
ESEM-FEI Quanta 200 Environmental SEM; 10nm Resolution, BSE, EDS, and Temperature Control
»
Atomic Content Characterization
,
Microscopy
,
Electron Microscopy
,
SEM
,
Image Analysis and Processing
,
Polymer Characterization
,
Structural Characterization
FESEM-FEI NanoSEM 630; 1.7nm Resolution, BSE, EDS, Beam Deceleration
»
Atomic Content Characterization
,
Microscopy
,
Electron Microscopy
,
SEM
,
Image Analysis and Processing
,
Polymer Characterization
,
Structural Characterization
FIB-FEI Quanta 200 3D FIB; 3.5nm SEM Resolution, 10nm Ga+ Beam, Pt GIS, and Selective Carbon Etch GIS
»
Focused Ion Beam
,
Microscopy
,
Electron Microscopy
,
SEM
,
Image Analysis and Processing
,
Structural Characterization
FIB-FEI Helios NanoLab 660; DualBeam SEM/FIB Platform-pushing the limits of extreme high resolution characterization in 2D an 3D, nanoprototyping, and sample preparation
»
Focused Ion Beam
,
Microscopy
,
Electron Microscopy
,
SEM
,
Image Analysis and Processing
,
Structural Characterization
FTIR-Bruker Hyperion 3000 Microscope; Transmission, Specular Reflectance, ATR, and Relflection Absoprtion
»
Image Analysis and Processing
,
Polymer Characterization
,
Circular Dichrosim
,
Spectroscopy
,
FTIR/Raman Spectroscopy
FTIR-Bruker IFS 66/S and Bruker Vertex V70; Near-IR/Mid-IR/Far-IR, Step Scan, Interchangeable Optical Components
»
Image Analysis and Processing
,
Polymer Characterization
,
Circular Dichrosim
,
Spectroscopy
Nanoindentation-Hysitron TriboIndenter TI 900; <1nN Load Resolution, Load or Displacement Controlled Measurments
»
Microscopy
,
Image Analysis and Processing
,
Scanning Probe Microscopy
Optical Profilometer-ZYGO NewView 7300; Surface Topography, Coating Thickness, Step Height, and 3D Imaging
»
Optical Characterization
,
Profilometry
,
Structural Characterization
Particle Sizing-Malvern Mastersizer "S"; Laser Diffraction for Coatings, Ceramics, Cosemetics, Cement, Food, and Clays
»
Polymer Characterization
,
Structural Characterization
Particle Sizing/Zeta Potential-Malvern Zetasizer ZS; Dynamic Light Scattering for Proteins, Polymers, Micelles, Carbohydrates, Nanoparticles, Colloidal Dispersions, and Emulsions
»
Polymer Characterization
,
Dynamic Light Scattering
,
Structural Characterization
Raman-WITec Confocal Raman
»
Image Analysis and Processing
,
Optical Characterization
,
Polymer Characterization
,
Spectroscopy
,
FTIR/Raman Spectroscopy
SAXS-Molecular Metrology SAXS
»
Polymer Characterization
,
Structural Characterization
,
X-ray Diffraction
STEM-FEI Titan 3 G2; 0.7A Resolution, EDS, EELS, and EFTEM
»
Atomic Content Characterization
,
Microscopy
,
Electron Microscopy
,
STEM
,
Image Analysis and Processing
STEM-JEOL 2010F; 2.0A Resolution, EDS, and EELS
»
Atomic Content Characterization
,
Microscopy
,
Electron Microscopy
,
STEM
,
Image Analysis and Processing
Surface Area-Gemini 2360 Surface Area Analyer
»
Polymer Characterization
,
Structural Characterization
Surface Area-Micromeritics ASAP 2020
»
Polymer Characterization
,
Structural Characterization
,
Porosimetry
Surface Area-Micromeritics ASAP 2920
»
Polymer Characterization
,
Structural Characterization
TEM-JEOL 2010; 2.3A Resolution, EDS, EELS and EFTEM
»
Atomic Content Characterization
,
Microscopy
,
Electron Microscopy
,
Transmission Electron Microscopy
,
Image Analysis and Processing
TEM-Phillips 420; 3.4A Resolution with EDS
»
Atomic Content Characterization
,
Microscopy
,
Electron Microscopy
,
Transmission Electron Microscopy
,
Image Analysis and Processing
TGA-MS-TGA Q50 with a Pfeiffer Vacuum Mass Spectrometer
»
Thermal Characterization
,
Thermo-Gravimetric Analysis
UV-VIS-NIR-Perkin-Elmer Lambda 950 UV-VIS NIR Spectrophometer
»
Optical Characterization
,
Optical Spectrometry
,
Polymer Characterization
,
Spectroscopy
XPS-Kratos Analytical Axiz Ultra
»
Atomic Content Characterization
,
Polymer Characterization
,
Structural Characterization
,
XPS
XRD-Multiwire Laue; Back-Reflection Mode for Single Crystal Applications
»
Polymer Characterization
,
Structural Characterization
,
X-ray Diffraction
XRD-PANalytical Empryean; Reflection Mode for Powder/Bulk Applications
»
Polymer Characterization
,
Structural Characterization
,
X-ray Diffraction
XRD-PANalytical Xpert Pro MPD; Reflection Mode for Powder/Bulk/Thin Film Applications
»
Polymer Characterization
,
Structural Characterization
,
X-ray Diffraction
XRD-Phillips MRD; Reflection Mode for Bulk and Thin Film Applications
»
Polymer Characterization
,
Structural Characterization
,
X-ray Diffraction
XRD-Rigaku DMAX-Rapid II; Reflection or Transmission Mode for Powder/Bulk/Thin Film/Single Crystal Applications
»
Polymer Characterization
,
Structural Characterization
,
X-ray Diffraction
Princeton University
Princeton Center for Complex Materials
Imaging and Analysis Center
Allied Multi Prep Polisher
AmScope Stereo Microscopes
»
Optical Microscopy
Anton Paar MCR501 Rheometer
»
Thermal Characterization
Anton Paar MCR502 Rheo-Confocal System
»
Thermal Characterization
Anton Paar MCR702 Rheometer
»
Thermal Characterization
Bruker D8 Advance XRD
»
X-ray Diffraction
Bruker D8 Discover X-Ray Diffractometer
»
X-ray Diffraction
Bruker Dimension ICON3 AFM
»
Scanning Probe Microscopy
Bruker Multimode AFM
»
Atomic Force Microscopy
Bruker NanoMan AFM Dimension 3000 AFM
»
Atomic Force Microscopy
Computer Cluster
»
Computing / Simulation
CreaTec LT-HV nc-AFM/STM
»
Scanning Probe Microscopy
Cressington Carbon Coater
»
Image Analysis and Processing
Diamond Knives
»
Image Analysis and Processing
Differential Scanning Calorimeter 8500 (DSC)
»
Calorimetry
Dimpler
»
Image Analysis and Processing
Dynamic Mechanical Analysis 8000 (DMA)
»
Thermal Characterization
Evactron Plasma Cleaner
»
Image Analysis and Processing
FEI CM100 TEM
»
Transmission Electron Microscopy
FEI CM200 FEG-TEM with EDS/EELS
»
Transmission Electron Microscopy
FEI Helios G3 DualBeam FIB/SEM with EDS
»
Focused Ion Beam
FEI Quanta 200 FEG Environmental-SEM with EDS/EEL
»
SEM
FEI StrataTM DB 235 FIB
»
Focused Ion Beam
FEI Verios 460 XHR SEM with EDS
»
SEM
FEI Vitrobot Units
»
Image Analysis and Processing
FEI XL30 FEG-SEM
»
SEM
Fischione 1010 dual-beam Ion Mill
»
Image Analysis and Processing
Fischione NanoClean Station
»
Image Analysis and Processing
FLS980 Steady State, Phosphorescence/Flourescence Lifetime Spectrometer
»
Spectroscopy
Glass Knife Maker
»
Image Analysis and Processing
Horiba Raman Spectrometer
Isitemp Oven
»
Image Analysis and Processing
Keithley 4200-SCS Semiconductor Characterization System
»
Thermal Characterization
Keyence VK-X1000 Confocal Microscope
»
Optical Microscopy
Leica Confocal DCM 3D
Leica Sputter Coater
»
Image Analysis and Processing
Leica Ultracut UCT Ultramicrotome Instrument
Low-speed Diamond Saw
»
Image Analysis and Processing
Nicolet iN10 MX FTIR
»
Spectroscopy
Optical Microscope w/CCD Camera
»
Image Analysis and Processing
Plasma Cleaner
»
Image Analysis and Processing
Reichert-Jung Ultracut E Microtome
»
Image Analysis and Processing
Rigaku MiniFlex XRD
»
X-ray Diffraction
Spectrometer (TGA-GC/MS)
»
Thermal Characterization
Talos F200X S/TEM with SuperX-EDS
»
Transmission Electron Microscopy
TEM sample cutter
»
Image Analysis and Processing
Thermo K-alpha X-ray Photoelectron Spectrometer (XPS/UPS)
»
Spectroscopy
Thermogravimetric Analyzer coupled to Clarus 680 SQ 8T Gas Chromatograph Mass
»
Thermo-Gravimetric Analysis
Tital Themis 80-300 Cubed Double Cs-corrected S/TEM with EDS
»
Transmission Electron Microscopy
Titan Krios G3 300 cryo-TEM
»
Transmission Electron Microscopy
Ultrasonic Cutter
»
Image Analysis and Processing
UV-VIS Cary 5000 Spectrometer
»
Spectroscopy
VCR IBS/TM 200S Ion Bean Sputterer
»
Image Analysis and Processing
Woollam M-2000 Ellipsometer
Zeiss Axios Scope A1 Transmission, Reflection, Polarizing Microscope
»
Optical Microscopy
Zeiss Discovery V12 Stereomicroscope
»
Optical Microscopy
Zeiss Xradias Versa 520 3D X-ray microscope
»
X-ray Diffraction
Micro/Nano Fabrication Laboratory (MNFL)
AG Associates / Mini-Pulse
AJA Dielectric Sputterer
Angstrom E-Beam
Angstrom Sputterer
Brewer Science / CEE 1100
Buehler / Minimet 1000
Cambridge NanoTech / Savannah 100
CPD - 030
CVD 2 Stack Furnace
Dektak / IIa
Denton / DV-502A
Dicing Saw/ADT proVectus 7100
Edwards / E306A
Electronic Micro Systems / 1000-1
Explorer / E 11140
Flip Chip Bonder / Research Devices / M8A
Gaertner L3W16
Headway / Spinners
Heidelberg / DWL66
K & S Wire Bonder
Karl Suss / MJB4
Karl Suss/ MA6
KLA-Tencor / P-15
Loomis / 789
Met One / GT-521
Mitutoyo / 543-523-1 and Mitutoyo / 542-256B
Nanonex / NX2000-4
NanoSpec / AFT
Optical Microscopes
Plasma-Therm / 720 SLR
Plasma-Therm / 790
Raith / e LINE
RCA Wet Hood
RTP-600S Rapid Thermal Annealer
SAMCO RIE200iP
SAMCO RIE800iPB
SemiTool Spin-Dryers
Spin Processor EDC-650Mz
STS
Technics / Micro 800
TePla / M4L
Thermco / Brute IV
Tystar Tytan Stack Four Horizontal Tube Furnaces LPCVD
UVOCS / T10X19 OES
Varian / 979
Varian ML91 Ampoule Sealer
VWR / 1410 Vacuum Oven
West Bond / 7400A
West Bond / 7700B
Yield Engineering Systems / YES-310TA
Princeton Institute for Computational Science and Engineering (PICSciE)/Terascale Infrastructure for Groundbreaking Research in Science and Engineering (TIGRESS)
Della
»
Computing / Simulation
University of California at Santa Barbara
Materials Research Laboratory: an NSF MRSEC
Microscopy and Microanalysis Facility
Asylum MFP-3D Bio System w/ Olympus IX71 Inverted Microscope
»
Scanning Probe Microscopy
Asylum MFP-3D Standard System w/Low Force Indenter
»
Scanning Probe Microscopy
FEI DB235 Dual-Beam Focus Ion Beam System (FIB) w/ EDS
»
Focused Ion Beam
FEI Inspect S Electron Scanning Microscope w/ Cathodoluminescence System
»
SEM
FEI Tecnai G2 Sphera Microscope for Life Science Studies
»
Transmission Electron Microscopy
FEI Tecnai G2 Sphera Microscope w/ EDS System for Materials Science Studies
»
Transmission Electron Microscopy
FEI Titan 300 kV FEG TEM/STEM System w/EDS & EELS
»
Transmission Electron Microscopy
,
STEM
FEI XL30 Sirion FEG Digital Electron Scanning Microscope
»
SEM
FEI XL40 Sirion FEG Digital Scanning Microscope w/EDS
»
SEM
Imago LEAP 3000X HR Atom Probe Microscope
»
Atom probe
Kratos Axis Ultra X-ray Photoelectron Spectroscopy (XPS) system
»
XPS
Physical Electronics 6650 Dynamic Secondary Ion Mass Spectrometry (SIMS)
»
SIMS
Veeco Dimension 3000/3100 Scanning Probe Microscope
»
Scanning Probe Microscopy
Veeco Multi-Mode NanoScope I & II
»
Scanning Probe Microscopy
Polymer Characterization Facility
DLS
»
Dynamic Light Scattering
DSC
»
Calorimetry
Gas Chromatograph
»
Gas Chromatography
GPC - DMF
»
Gel Permeation Chromatography
GPC - chloroform
»
Gel Permeation Chromatography
GPC - MALS
»
Gel Permeation Chromatography
GPC - Prep
»
Gel Permeation Chromatography
Microwave Reactor (Biotage)
»
Microwave Reactor
Microwave Reactor (CEM)
»
Microwave Reactor
Nano ITC
»
Calorimetry
Rheometer with oven
»
Rheometry
Rheometer with water bath
»
Rheometry
Viscolite 700HP Bench Viscometer
»
Structural Characterization
Spectroscopy Facility
ASCEND 400MHz WB NMR/DNP Spectrometer for Solids
»
NMR - Nuclear Magnetic Resonance
Avance 800MHz SB NMR Spectrometer for Solids/Liquids
»
NMR - Nuclear Magnetic Resonance
Avance DMX500MHz SB NMR Spectrometer for Solution
»
NMR - Nuclear Magnetic Resonance
Avance DSX300MHz WB NMR Spectrometer for Solids
»
NMR - Nuclear Magnetic Resonance
Avance IPSO500MHz WB NMR Spectrometer for Solids
»
NMR - Nuclear Magnetic Resonance
Bruker 300MHz SWB MRI/Diffusion Spectrometer
»
NMR - Nuclear Magnetic Resonance
Bruker EMXplus EPR Spectrometer
»
NMR - Nuclear Magnetic Resonance
Nicolet Magna 850 FTIR Spectrometer with FT-Raman module
»
FTIR/Raman Spectroscopy
Q-Sense E4 Quartz Crystal Microbalance (QCM-D)
»
Structural Characterization
Varian Cary Eclipse Fluorimeter
»
Optical Spectrometry
Varian VNMRS 600MHz SB NMR Spectrometer for Solution
»
NMR - Nuclear Magnetic Resonance
TEMPO Facility
Differential Scanning Calorimeter
»
Calorimetry
DynaCool PPMS
»
PPMS
High Temperature Powder XRD
»
X-ray Diffraction
Horiba FluoroMax 4 spectrometer
Inductively Coupled Plasma
»
ICP Atomic Emission Spectroscopy
METTLER TGA/sDTA851e ThermoGravimetric Analyzer With Blazers ThermoStar 300 AMU Mass Spectrometer
»
Thermo-Gravimetric Analysis
Micromeritics AccuPyc 1340 Pycnometer
MicroMeritics TriStar Porosimeter
»
Porosimetry
Physical Properties Measurement System
»
PPMS
Quantum Design MPMS 5XL SQUID Magnetometer
»
SQUID Magnetometry
Shimadzu UV3600 UV-Nir-NIR Spectrometer
»
Optical Spectrometry
The Olympus BX41 Fluorescence Microscope
»
Optical Microscopy
Thermogravimetric Analyzer
»
Thermo-Gravimetric Analysis
Thermogravimetric Analyzer Mass Spectrometer
»
Atomic Content Characterization
Terahertz Facility
The UCSB Free Electron laser source
»
Free Electron Laser
X-ray Facility
Ancillary Equipment
»
Optical Characterization
Confocal Microscope
»
Optical Characterization
Four Circle Wide Angle X-ray Diffractometer(WAXS)
»
X-ray Diffraction
Intermediate Small Angle Diffractometer (2-Circle)
»
X-ray Diffraction
Panalytical MRD PRO Materials Research Diffractometer
»
X-ray Diffraction
Philips X’PERT MPD
»
X-ray Diffraction
Rigaku Smartlab High-Resolution Diffractometer
»
X-ray Diffraction
Small Angle X-ray Scattering (SAXS) Diffractometer
»
X-ray Diffraction
University of Chicago
Chicago Materials Research Center
Fast X-Ray Imaging Facility
OrthoScan HD mini C-arm X-ray system
Image Processing Facility
Vision Research Phantom High-Speed Cameras
»
Image Analysis and Processing
Institute for Biophysical Dynamics Nanobiology Facility
ISS ChronosBH TCSPC Fluorometer
»
Confocal Fluorescence Microscopy
,
Spectroscopy
Materials Preparation and Measurement Laboratory (MPML)
Agilent 8453 UV/VIS Spectrophotometer
»
Optical Spectrometry
Agilent Cary 5000 UV/VIS/NIR Spectrophotometer
»
Optical Spectrometry
Asylum Cypher ES AFM
»
Atomic Force Microscopy
Asylum MFP-3D-BIO AFM
»
Atomic Force Microscopy
Bruker Multimode 5 AFM with Nanoscope IIIa Controller
»
Atomic Force Microscopy
Bruker Multimode 8 AFM with Nanoscope V Controller
»
Atomic Force Microscopy
Bruker Standalone STM with Nanoscope IIIa Controller
»
Scanning Tunneling Microscopy
Buehler ECOMET 3
»
Synthesis and Fabrication
Carl Zeiss Merlin SEM
»
Electron Microscopy
,
SEM
FEI Nova NanoSEM 230
»
SEM
Gaertner Stokes WAFERSKAN Ellipsometer
»
Ellipsometry
Hitachi S-2700
»
SEM
HJY Fluorolog-3 Spectrofluorometer
»
Optical Spectrometry
Kulicke & Soffa 4526 Wire Bonder
»
Wire Bonding
LabRamHR Evolution Confocal Raman Microscope
»
Microscopy
,
Optical Microscopy
,
FTIR/Raman Spectroscopy
Low Speed Diamond Wheel Saw
Malvern Zetasizer Nano ZS
»
Dynamic Light Scattering
MINIMET 1000 Grinder-Polisher
»
Synthesis and Fabrication
Optical Microscope
»
Optical Microscopy
Plasma Etch PS-100LF
»
Etching
Quartz Tube Furnaces
»
Furnaces
South Bay Technology RIE-2000
Specialty Coating Systems Spincoater P6700
»
Lithography
TA Instruments SDT Q600 DSC/TGA
»
Calorimetry
,
Thermo-Gravimetric Analysis
Ted Pella Sputter Coater
»
Thin Film Processing and Deposition
ULS VLS4.60 Laser Cutter
»
Synthesis and Fabrication
UV Exposure System
»
Lithography
V&N E-Gun Evaporator
»
Thin Film Deposition
Microfluidics Facility
Harrick PDC-001 Plasma Cleaner
Quantum Transport Laboratory
Alcatel ASM GraphD+ He Leak Checker
PPMS
»
PPMS
Rheometry Facility
Anton Paar MCR 301 rheometer
»
Rheometry
Transmission Electron Microscopy
FEI Tecnai G2 F30 Super Twin microscope
»
Transmission Electron Microscopy
FEI Tecnai Spirit Bio-Twin
»
Transmission Electron Microscopy
University of Colorado, Boulder
Liquid Crystal Materials Research Center
Freeze-Fracture Transmission Electron Microscopy
100 KV TEM
»
Transmission Electron Microscopy
Freeze-etch system
»
Etching
X-ray Diffraction Facility
single-crystal x-ray scattering system
»
X-ray Diffraction
wide angle x-ray scattering system
»
X-ray Diffraction
University of Delaware
University of Delaware Center for Hybrid, Active, and Responsive Materials
UD Advanced Materials Characterization Lab
Mass Spec & Chemical Analysis (Metrohm IC Pro, Elementar CHNS, Agilent 7500 ICP/MS, Thermo Fisher ICAP/TQ)
»
Mass/Density Characterization
Porosity & Particle Size (Wyatt Mobius DLS Zeta Potential, Micromeritics ASAP 2020 BET Analyzer, Beckman Coulter LS 13 320 Particle Size Analyzer, VCA optima Contact Angle, Sigma 700 Surface Tension)
»
Porosimetry
Thermal Analysis (TA DTC 300, TA Q800 DMA, TA Q600 HT TGA/DSC, Discovery DSC, Discovery TGA)
»
Thermal Characterization
Vibrational (Anasys Nano IR2, FTIR, ATIR, Rama Spectrometer, neaSNOM Microscope)
»
Microscopy
X-Ray Analysis (Bruker D8 XRD, Rigaku Ultima IV XRD, Rigaku Supermini 200 WDXRF, Xenocs SAXS/WAXS, Rigaku NANO 3DX CT Scanner, Rigaku GX 130 CT Scanner)
»
X-ray Diffraction
UD Keck Center for Advanced Microscopy and Microanalysis
Auriga 60 CrossBeam (FIB/FE-SEM)
»
Microscopy
Dimension-3100 V SPM
»
Microscopy
JEM-2010F (200kV FE-TEM)
»
Microscopy
JEM-3010 (300kV TEM)
»
Microscopy
JSM-7400F (FE-SEM)
»
Microscopy
MultiMode NanoScope V SPM
»
Microscopy
Talos F200C (200kV FE-TEM)
»
Microscopy
Tecnai G2 12 (120kV TEM)
»
Microscopy
UD Materials Growth Facility
AJA ATC-2200-UHV sputtering system
»
MBE
,
Thin Film Deposition
Veeco GENxplor MBE - chalcogenides
»
MBE
,
Thin Film Deposition
Veeco GENxplor MBE - III-V semiconductors
»
MBE
,
Thin Film Deposition
UD Materials Growth Facility
»
Synthesis and Fabrication
,
Crystal Growth
,
MBE
,
Thin Film Processing and Deposition
,
Thin Film Deposition
University of Delaware Nanofabrication Facility
Deposition (ALD, Evaporators, PECVD, PLD, Sputterer)
»
Microfabrication / Microelectronics / Clean Room
Dry Etch (Asher, Chlorine ICP, Fluorine ICP, Ion Mill, Plasma Cleaner)
»
Microfabrication / Microelectronics / Clean Room
Film Casting (E-beam SBU1, E-beam SBU2, Photo SBU1, Photo SBU2, SU-8 SBU)
»
Microfabrication / Microelectronics / Clean Room
Lithography (E-beam Writer, Laser Writer, Mask Aligner)
»
Microfabrication / Microelectronics / Clean Room
Metrology (Ellipsometer, Four-Point Probe Station, Microscopes, Profilometer, SEM)
»
Microfabrication / Microelectronics / Clean Room
Miscellaneous (Critical Point Dryer, Developing Station, Mask Cleaner Station, Ozone Cleaner, Wet Benches)
»
Microfabrication / Microelectronics / Clean Room
Packaging (Dicing Saw, Wire Bonder)
»
Microfabrication / Microelectronics / Clean Room
Thermal Processing (HMDS Oven, Rapid Thermal Processor, Tube Furnace, Vacuum Ovens)
»
Microfabrication / Microelectronics / Clean Room
University of Illinois at Urbana-Champaign
Illinois MRSEC
Materials Research Laboratory Central Research Facilities
Biological sample preparation and analysis services
»
Structural Characterization
,
Polymer Processing
Center for Excellence in Soft Materials
»
Structural Characterization
,
Dynamical Mechanical Analysis
,
Thermal Characterization
,
Calorimetry
,
Thermo-Gravimetric Analysis
Electron Microscopy Core
»
Electron Microscopy
Laser and Optical Spectroscopy
»
Optical Characterization
,
Spectroscopy
Micro/Nano Fabrication and Cleanroom
»
Synthesis and Fabrication
,
Thin Film Processing and Deposition
,
Thin Film Deposition
,
Microfabrication / Microelectronics / Clean Room
,
Lithography
,
Etching
,
Furnaces
Scanning probe microscopy
»
Scanning Probe Microscopy
,
Atomic Force Microscopy
,
Scanning Tunneling Microscopy
Surface Analysis
»
Atom probe
,
Profilometry
,
LEED/Auger Electron Spectroscopy
,
Rutherford Backscattering Spectrometry
,
SIMS
,
XPS
X-ray analysis
»
X-ray Diffraction
University of Maryland
UMD Materials Research Science and Engineering Center
Small Spot X-Ray Photoelectron Spectrometer
Kratos Axis 165 XPS
»
XPS
University of Massachusetts Amherst
UMass Amherst Materials Research Science and Engineering Center
Electron and Optical Microscopy
FEI Magellan 400 Scanning Electron Microscope
»
SEM
FEI TecnaiT12 Transmission Electron Microscope
»
Transmission Electron Microscopy
JEOL 2200FS Energy Filtered Transmission Electron Microscope
»
Transmission Electron Microscopy
JEOL JEM-2000FX Transmission Electron Microscope
»
Transmission Electron Microscopy
JEOL JSM-6320 Scanning Electron Microscope
»
SEM
Leica SP2 Laser Scanning Confocal Microscope
»
Confocal Fluorescence Microscopy
Olympus BX-51 Optical Microscope
»
Optical Microscopy
Gel Permeation Chromatography
Agilent 1100 (MALLS)-Currently in Tetrahydrofuran
»
Gel Permeation Chromatography
Agilent 1200-Trifluoroethanol
»
Gel Permeation Chromatography
Agilent 1260-Tetrahydrofuran
»
Gel Permeation Chromatography
Knauer-Dimethylformamide
»
Gel Permeation Chromatography
Polymer Labs- Trichlorobenzene (High Temperature)
Polymer Labs-Aqueous
Polymer Labs-Chloroform
Mass Spectrometry Facility (UMASS-MSC)
ABI-SCIEX QSTAR-XL
Bruker OmnifleX MALDI-TOF
Esquire-LC Ion Trap
HP 5890 Series II Gas Chromatograph
»
Gas Chromatography
JEOL-700 MStation
Nanostructures Laboratory
DI Dimension-3000 and Dimension-3100 AFM
»
Atomic Force Microscopy
DI Nanoscope-IV Multimode AFM
»
Atomic Force Microscopy
Filmetrics Optical Profilometer
»
Profilometry
Sopra Variable Angle Spectroscopic Ellipsometer
Veeco Dektak Stylus Profilometer
»
Profilometry
Nuclear Magnetic Resonance Facility
Agilent 700
»
NMR - Nuclear Magnetic Resonance
Avance400
»
NMR - Nuclear Magnetic Resonance
DPX300
»
NMR - Nuclear Magnetic Resonance
DSX300
»
NMR - Nuclear Magnetic Resonance
Infinity300
»
NMR - Nuclear Magnetic Resonance
Rheology Facility
AIC Linear Rheometer
»
Rheometry
Gottfert Rheograph Capillary Melt Rheometer
»
Rheometry
Rheometrics Mechanical Spectrometer
University of Minnesota
UMN Materials Research Science and Engineering Center
Characterization Facility (CharFac)
2 meter – 2D Area Detector
»
X-ray Diffraction
6 meter - 2D Area Detector
»
X-ray Diffraction
Agilent 5500 environmental SPM plus high-speed force-curve mapping and multifrequency methods
»
Scanning Probe Microscopy
Agilent 5500 environmental SPM plus inverted light microscope
»
Scanning Probe Microscopy
Auger Electron Spectroscopy
»
LEED/Auger Electron Spectroscopy
Bruker Nanoscope V Multimode 8 with QNM
»
Scanning Probe Microscopy
Bruker-AXS Microdiffractometer
»
X-ray Diffraction
Cold Field Emission Gun Scanning Electron Microscope
»
SEM
Confocal Raman Microscope
»
FTIR/Raman Spectroscopy
Diffractometer
»
X-ray Diffraction
Diffractometer
»
X-ray Diffraction
FEI Tecnai G2 F30
Field Emission Gun Cryo Transmission Electron Microscope
»
Transmission Electron Microscopy
Field Emission Gun Scanning Electron Microscope
Field Emission Gun Scanning Electron Microscope
»
SEM
Field Emission Gun Transmission Electron Microscope
»
Transmission Electron Microscopy
Fourier-Transform Infrared Spectrometer (FTIR)
»
FTIR/Raman Spectroscopy
Ion Beam Analysis
»
Focused Ion Beam
Microdiffractometer
»
X-ray Diffraction
micromechanical tester
Microscopic Contact Angle Meter
NanoIndenter
Nanoscope V Multimode 8
»
Atomic Force Microscopy
Panalytical X'Pert Pro
»
X-ray Diffraction
Spectroscopic Ellipsometer
Tencor P10 Profilometer
Theta-Theta Diffractometer
»
X-ray Diffraction
Transmission Electron Microscope
»
Transmission Electron Microscopy
Transmission Electron Microscope
»
Transmission Electron Microscopy
Transmission Electron Microscope
»
Transmission Electron Microscopy
Transmission Electron Microscope
»
Transmission Electron Microscopy
Triboindenter
Video-Enhanced Microscope (VEM)
X-Ray Diffractometer
»
X-ray Diffraction
X-Ray Diffractometer
»
X-ray Diffraction
X-ray Photoelectron Spectroscopy (ESCA)
X-ray Photoelectron Spectroscopy (ESCA)
Mass Spectrometry Lab
4800 MALDI-TOF/TOF Mass Spectrometer
5800 MALDI-TOF/TOF Mass Spectrometer
Bruker BioTOF II
CyTOF2 Mass Cytometer
Waters Acquity UPLC/Synapt G2 QTOF MS
Waters Acquity UPLC/TQD
Minnesota Nano Center (MNC)
AJA Sputterer
AJA Sputterer 2
ALD
Amray FESEM
Asher
Atomic Force Microscope
AV Etcher
Canon Stepper
CEE 200X Spinner
CHA Evaporator
Confocal Microscope
»
Microscopy
Critical Point Dryer
CV-IV
DC Sputter
Deep Trench Etcher
Dektak
Exhausted Blue M Oven
»
Ovens
FEI FIB
»
Focused Ion Beam
Four Point Probe
Gaertner Ellipsometer
Hard Bake Oven
»
Ovens
Headway
Ion Mill
JEOL SEM
»
SEM
Karl Suss Contact Mask Aligner
»
Lithography
Karl Suss Contact Mask Aligner
KLA-Tencor P-16
LPCVD
Mask Maker
Mini-Brute Furnace
MJB-3
Nanonex NX-B200 Nanoimprinter
Nanospec-1
Nanospec-2
Oriel
Oxford
»
Etching
PECVD
Prebake Dehydration Oven
»
Ovens
Precision Spin Coater
Precision Spin Coater
RTA-1
Rudolph Ellipsometer
SB6
Soft Bake Oven
»
Ovens
Spray/Puddle Developer
Stress Test-1
STS Etcher
»
Etching
SUPER-NUOVA Hot Plates
»
Ovens
Temescal E-beam
Thermal Evaporator
Tylan Furnace Bank
UVO Cleaner
Varian E-beam
Vistec EBPG5000+
»
Lithography
Wafer Saw
Wet Benches
Xenon di-fluoride e1-series etching system
»
Etching
YES 310
Nuclear Magnetic Resonance (NMR) Lab
Bruker Avance III 500
»
NMR - Nuclear Magnetic Resonance
VAC-200
»
NMR - Nuclear Magnetic Resonance
VAC-300
»
NMR - Nuclear Magnetic Resonance
Varian Inova 300
»
NMR - Nuclear Magnetic Resonance
Varian Inova 500
»
NMR - Nuclear Magnetic Resonance
VXR-300
»
NMR - Nuclear Magnetic Resonance
Polymer Characterization Facility
Agilent PL-GPC 220 High Temperature GPC/SEC System Waters Modular Room Temperature System
»
Gel Permeation Chromatography
DACA Mixer and Molder
Extensional tools for rotational rheometers
»
Rheometry
Goettfert Visco-Tester 1500
»
Rheometry
Malvern Rosand RH7
»
Rheometry
Rheometric Scientific RSA-11
»
Rheometry
Rheometric Scientific SR200
»
Rheometry
TA Instruments AR-G2
»
Rheometry
TA Instruments ARES-G2
»
Rheometry
TA Instruments DHR-3
»
Rheometry
TA Instruments Q1000 for -180 to 300 degrees C
»
Calorimetry
TA Instruments Rheometric Series ARES
»
Rheometry
TA Instruments RSA-G2
»
Rheometry
Thermo Electron Polylab with Rheomix 600
»
Rheometry
Thermo Electron PRISM 16mm Twin Screw Extruder
X-Ray Crystallographic Facility
Bruker-AXS SMART APEX-II
»
X-ray Diffraction
Bruker-AXS Venture PHOTO-100 Kappa axis
»
X-ray Diffraction
University of Nebraska
UNL Materials Research Science and Engineering Center
Electron Nanoscopy Instrumentation
FEI Nova NanoSEM 450
»
SEM
FEI Tecnai Osiris (S)TEM
»
Electron Microscopy
JEOL JEM 2010 TEM
»
Transmission Electron Microscopy
Specimen Preparation Equipment
»
Electron Microscopy
Nanofabrication and Clean-Room
AJA ATC-ORION 8000 E-beam Evaporation System
»
Thin Film Deposition
Electron Beam Lithography System (EBL)
»
Lithography
FEI Strata 200xp Focused-Ion Beam Workstation
»
Focused Ion Beam
Intlvac Nanoquest-I Ion Beam Etching and Milling System
»
Etching
Nanomaterials & Thin Films
ATC-2000F AJA Sputtering System
»
Thin Film Deposition
PVD PLD-MBE 2500 Pulsed Laser Deposition System
»
Pulsed Laser Deposition
Surface & Materials Characterization
Bruker Dimension ICON Atomic Force Microscope
»
Scanning Probe Microscopy
DI EnviroScope Atomic Force Microscope
»
Scanning Probe Microscopy
DI Nanoscope IIIa Dimension 3100 SPM system
»
Scanning Probe Microscopy
Thermal Analysis Systems
»
Thermal Characterization
X-Ray Structural Characterization
Bruker Photon 100 Single Crystal Diffractometer
»
X-ray Diffraction
Bruker-AXS D8 Discover Diffractometer
»
X-ray Diffraction
PANalytical Empyrean Diffractometer
»
X-ray Diffraction
Rigaku D/Max-B Diffractometer
»
X-ray Diffraction
Rigaku Multiflex Diffractometer
»
X-ray Diffraction
Rigaku SmartLab Diffractometer
»
X-ray Diffraction
University of Pennsylvania
The Laboratory for Research on the Structure of Matter
Dual Source and Environmental X-ray Scattering
Multi-angle x-ray diffractometer system (MAXS)
»
X-ray Diffraction
Electron Microscopy Facility
F200 scanning / transmission electron microscope
»
Transmission Electron Microscopy
FEI 600 Quanta FEG ESEM
»
SEM
FEI Strata DB235 Focused Ion Beam
»
Focused Ion Beam
JEOL 2010 TEM
»
Transmission Electron Microscopy
JEOL 2010F FEG HRTEM
»
Transmission Electron Microscopy
JEOL 7500F HRSEM
»
SEM
NEOARM Aberration-corrected scanning / transmission electron microscope
»
Transmission Electron Microscopy
Optical Imaging and Micromanipulation
Brookhaven Instruments, BI-200SM
Leica DMIR13/VT-Eye Confocal
»
Confocal Fluorescence Microscopy
Leica DMRX
Leica DMRX A2 (Spinning Disk Confocal equipment available)
»
Optical Microscopy
Nikon Eclipse 200/Confocal VT Eye
»
Optical Microscopy
VisiTech 'VT-Eye'
Zeiss Axiovert 135/Optical Tweezer
»
Optical Microscopy
Property Measurement Facility
Princeton Instruments TriVista Spectrometer with Si and InGaAs array detectors
»
Spectroscopy
Quantum Design Magnetic Property Measurement System (SQUID magnetometer)
»
SQUID Magnetometry
Quantum Design Physical Properties Measurement System
»
PPMS
Rheology Center
Bohlin Gemini
»
Rheometry
Haake CaBER
»
Rheometry
Instron Model 5564 Table Mounted Materials Testing System
Nikon Eclipse 200/Confocal VT Eye
»
Optical Microscopy
TA Instruments RFS II
»
Rheometry
University of Texas – Austin
Center for Dynamics and Control of Materials
CDCM Shared Experimental Facilities
Andor spectrometer
»
Spectroscopy
BI-200SM laser light scattering system
»
Dynamic Light Scattering
Cryostation s100 (Fusion) Foundation (NEMA)
»
Optical Characterization
Discovery Hybrid Rheometer
»
Rheometry
Glove Box
»
Synthesis and Fabrication
Glove Boxes
»
Synthesis and Fabrication
Harmonic Generator HIRO
»
Spectroscopy
High Power Femtosecond DPSSL System CARBIDE-40W
»
Spectroscopy
Optical Parametric Amplifiers ORPHEUS-HP-SH-DFG OPA
»
Spectroscopy
Scanning near-field optical microscope (NeaSNOM)
»
Optical Microscopy
,
Near Field Scanning Microwave Microscopy
,
Optical Characterization
,
Optical Spectrometry
,
Spectroscopy
,
FTIR/Raman Spectroscopy
Superconducting Nanowire Single-Photon Detectors
»
Optical Characterization
,
Optical Spectrometry
,
Spectroscopy
White Light Generator
»
Spectroscopy
Texas Materials Institute
Atomic Force Microscope: Asylum Research MFP-3D System
»
Atomic Force Microscopy
Atomic Force Microscopes: Park Scientific
»
Atomic Force Microscopy
University of Utah
Next Generation Materials for Plasmonics and Organic Spintronics
Surface Analysis and nano-Scale Imaging in the Micron Technology Foundation, Inc. Microscopy Suite
Atomic Force Microscope
Digital Comparator (Vertex 220 microVu)
»
Optical Microscopy
Imaging System, XPS
Ion Polishing Mill
JEM 2800 analytical S/TEM with dual 100mm2 EDS detectors
»
STEM
Microscope, BF/DF/Nomarski
Microscope, Scanning Laser Confocal Fluorescence
Optical Profilometer
SEM
SEM with Dual Beam FIB
SEM with EDAX
Spectroscopic Ellipsometer
Vibrating magnetometer (Microsense FCM-10)
»
Magnetic Characterization
XRF Analyzer
Utah MRSEC Affiliated Labs
(3+3)-Pass Tandem Fabry-Perot Interferometer
»
Optical Characterization
Analytical Laser Spectroscopy Laboratory
»
Spectroscopy
Femtosecond Laser Systems
Mechanical Behavior Laboratory
Microsystems Lab
Microtomography Lab: MicroCT
»
Microscopy
Organic spintronics Deposition System
»
Synthesis and Fabrication
The Magnetic Resonance Laboratory (EPR, ENDOR, ELDOR)
»
Spectroscopy
The Sagnac Interferometer Laboratory MOKE
»
Optical Characterization
THz Time-Domain Spectrometer
»
Optical Characterization
Utah State Center for Excellence for Biomedical Microfluidics
»
Synthesis and Fabrication
UV Time-Resolved Spectroscopy System based on a Coherent Chameleon ultrafast laser
»
Spectroscopy
UtahNanofab
ALD System
Aligner
Aligner
Aligner
Analytical Probe Station
CMP System
CV System
Dicing Saw
Dicing Saw
Diffusion/Anneal Furnace
E-Beam Evaporator
E-Beam Evaporator
Electrical Test Station
Heidelberg uPG101 900nm, 1um, 5um
»
Lithography
Laser Micromachining System
Laser Pattern Generation System
Lasermarker, Nd-YAG
LPCVD Doped/Undoped Polysilicon
LPCVD LTO/PSG
LPCVD Nitride
LPCVD Nitride
LPCVD Polysilicon
LPCVD TEOS
microfluidics prototyping (uWire EDM, laser uWelding, PDMS process, UV cure)
»
Polymer Processing
Oven
Oven, Vapor Prime
Oxidation Furnace
Parylene Coater
PECVD Deposition
Plasama Etcher, DRIE
Plasma Etcher
Plasma Etcher, DRIE
Plasma Etcher, Dry Isotropic
Plasma Reactive Ion Etcher
Spin Coater
Spin Coater
Spin Coater
Spin Develop/Etcher
Sputtering System
Sputtering System
Surface Profiler
Surface Profiler
Thin Film Stress Measurement System
Thin Film Thickness Measurement System
Thin Film Thickness Measurement System
Wafer Bonder
Wet Benches and SRD's
Wire Bonder
University of Washington
Molecular Engineering Materials Center
MEM-C Shared Facilities
Bruker Edge AFM
»
Atomic Force Microscopy
Bruker Icon AFM
»
Atomic Force Microscopy
CEM Discover SP Microwave synthesizer
»
Synthesis and Fabrication
Diamond Anvil Cell (DAC)
»
Spectroscopy
Edinburgh FLS1000 luminescence Spectrometer
»
Spectroscopy
Glovebox and transfer stage with integrated microscopy
»
Optical Microscopy
NanoITC isothermal titration calorimeter (ITC)
»
Thermal Characterization
Phosphorus XES Spectrometer
»
Spectroscopy
Pulsed Laser Deposition System
»
Pulsed Laser Deposition
Thermal Evaporator
»
Thermal Characterization
Xenocs Xeuss 3.0 Small Angle X-ray Scattering (SAXS)
»
X-ray Diffraction
University of Wisconsin-Madison
Materials Research Science and Engineering Center on Structured Interfaces
The Nanoscale Fabrication Center (NFC)
Four-Point Probe
Aligner for EV 801 Bonder
Aluminum Wedge Bonder
Anneal Oven
Anneal Oven
Automegasamdri 915B Critical Point Dryer
Buffered Oxide Etch Chemical Bench
Chemical Bench
Chemical Bench ("DAE Bench")
»
Etching
Chemical bench (Prefurnace Clean)
»
Etching
Chemical bench for teaching
Chemical bench for teaching
Contact Aligner / IR Back Side Aligner
Contact Aligner / IR Back Side Aligner
Contact Aligner, 3" wafers;
Contact Aligners for 4-inch Wafers
DC Sputterer
Dicing Saws
Die Attacher
E-beam Evaporator
E-Beam Evaporator
E-beam Evaporator
Elionix ELS-G100 Electron Beam Lithography System
»
Lithography
Fiji G2 Atomic Layer Deposition System
»
Thin Film Deposition
Film Stress Measurement
Filmetrics
Forming Gas Metal Anneal Furnace
Furnace Tube 1
Furnace Tube 3
Furnace Tube 4
Furnace Tube 6
General-Use Steam Oxidation Furnace Tube 2
Gold Ball Bonder
Heidelberg DWL 66+ laser writer lithography system
»
Lithography
high-density plasma RIE
III-V Semiconductor Chemical Bench
Indium Evaporator
Lithography Ovens
Low-Temperature Oxide Furnace
Metal Etcher
Non-Litho Spinner
Optical microscope with Camera and PC
Optical microscope with Camera and PC
Photoresist spincoater for teaching
Piranha Bench
»
Etching
PLA-501 Contact Aligner;
Plasma Asher & Stripper
»
Etching
Plasma Therm Apex SLR ICP plasma etching system
»
Etching
PlasmaTherm
Polysilicon LPCVD Furnace
»
Thin Film Deposition
Probe Station
Programmable Photoresist Spinner #2 - SU8
Programmable Photoresist Spinners #1 and #3 - General Use
Programmable Polymer Oven
Programmable Polymer Oven
Projection Litho Exposure Stepper
Rapid Thermal Annealer
Reactive-Ion Etcher
RF/DC Sputterer
Silicon Deep RIE
»
Etching
Silicon Wet Etch Bench
»
Etching
Solvent Bench
Solvent Benches
Spin-Rinse Dryer
Spin-Rinse Dryer
Spin-Rinse Dryer
Spin-Rinse Dryer (SRD)
»
Thin Film Processing and Deposition
SU8 Solvent Bench
Surface Profilometer (3 units)
»
Profilometry
Thermal Anneal Furnace for Metals ("Aluminum Anneal Tube")
Unaxis 790 RIE
UV-Ozone Stripper/Cleaner
Wafer Bonder
Wafer Scribe
Wet/Dry Oxidation Furnace
Wet/Dry Oxidation Tube, Classroom Bay
The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison
Bruker D8 Discover Diffractometer X-Ray Diffractometer (XRD)
»
X-ray Diffraction
Bruker Icon AFM
»
Atomic Force Microscopy
Bruker Multimode 8 Atomic Force Microscope (AFM, SPM)
»
Atomic Content Characterization
,
Scanning Probe Microscopy
,
Atomic Force Microscopy
,
Profilometry
Cameca IMS-4fE7 Secondary Ion Mass Spectrometer
»
SIMS
Dynacool PPMS
»
PPMS
FEI Titan Aberration-corrected (S)TEM
»
Microscopy
,
Electron Microscopy
,
Transmission Electron Microscopy
,
STEM
Horiba LabRAM HR Evolution Raman Spectrometer
»
Image Analysis and Processing
,
Optical Microscopy
,
Confocal Fluorescence Microscopy
,
Optical Characterization
,
Optical Spectrometry
,
FTIR/Raman Spectroscopy
Hysitron TI950 Triboindenter
»
Dynamical Mechanical Analysis
Leica EM TiC 3X Ion Beam Milling System
»
SEM
Malvern PANalytical X'Pert PRO X-Ray Diffractometer (XRD)
»
X-ray Diffraction
Micro FT-IR Spectrometer
»
FTIR/Raman Spectroscopy
NanoMill
PANalytical Empyrean X-ray diffractometer
»
X-ray Diffraction
Tecnai TF-30 300KV Field Emission Scanning Transmission Electron Microscope (FE STEM)
»
Electron Microscopy
,
Transmission Electron Microscopy
,
STEM
ThermoFisher Helios G4 UX Plasma Focused Ion Beam/Field Emission Scanning Electron Microscope
»
Focused Ion Beam
Wisconsin MRSEC X-ray Endstation for Nanoscale Transformations (MXNT)
»
X-ray Diffraction
,
Thin Film Deposition
X-ray Photoelectron Spectrometer (XPS)
»
XPS
Zeiss Auriga Focused Ion Beam FIB/FESEM
»
Focused Ion Beam
,
SEM
Zeiss Gemini 300 FESEM
»
SEM
Zeiss Gemini 450 FESEM
»
SEM
Zeiss Leo 1530 FESEM/EDS/EBSD
»
SEM
ZYGO 9000 Optical Profilometer
»
Optical Microscopy
,
Optical Characterization
,
Profilometry
,
Structural Characterization
The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison
Auxiliary Equipment
»
SEM
,
Scanning Probe Microscopy
,
Atomic Force Microscopy
,
Ellipsometry
,
Optical Spectrometry
,
Polymer Characterization
,
Dynamic Light Scattering
,
Gel Permeation Chromatography
,
Rheometry
,
Thermal Characterization
,
Ovens
,
Lithography
,
Furnaces
,
Polymer Processing
,
FTIR/Raman Spectroscopy
Differential Scanning Calorimeter (DSC) Q100
»
Thermal Characterization
,
Calorimetry
,
Polymer Processing
Gel Permeation Chromatograph GPCmax
»
Gel Permeation Chromatography
JA Woollam IR-VASE Mark II Ellipsometer
»
Ellipsometry
JA Woollam VASE+AR Ellipsometer
»
Ellipsometry
LEO 1550 FESEM
»
SEM
Malvern Zetasizer Nano ZSP
»
Dynamic Light Scattering
Q-Sense E4 quartz crystal microbalance
»
Polymer Characterization
Rheometer - Advanced Rheometric Expansion System (ARES)
»
Mass/Density Characterization
,
Polymer Characterization
,
Structural Characterization
,
Polymer Processing
,
Spectroscopy
RSA III Dynamic Mechanical Analyzer
»
Structural Characterization
Thermo Scientific DXRxi Raman imaging microscope
»
Image Analysis and Processing
,
Spectroscopy
,
FTIR/Raman Spectroscopy
Thermogravimetric Analyzer (TGA) Q500
»
Calorimetry
,
Thermo-Gravimetric Analysis
Yale University
CRISP: Center for Research on Interface Structures and Phenomena
Imaging and Characterization Facility
Bruker Fastscan AFM
»
Atomic Force Microscopy
Bruker multimode AFM
»
Atomic Force Microscopy
Denton Desk V chromium sputtering tool
»
Atomic Force Microscopy
FEI Tecnai Osiris 200kV TEM for material science
»
Transmission Electron Microscopy
FEI XL40 SEM
»
SEM
Fischione 1050 TEM thinning mill
Hitachi SU-70 high resolution SEM
»
SEM
KLA Tencor Alphastep 200 profilometer
»
Profilometry
Leica Cryo-Microtome
»
Microscopy
Rotating Anode X-Ray Source
»
X-ray Diffraction
Vistec EBPG 5000+ electron-beam lithography
»
Lithography
Materials Synthesis Facility
Combinatorial sputtering
»
Synthesis and Fabrication
Cryogen-free Physical Property Measurement System (PPMS - Dynacool)
»
PPMS
Molecular Beam Epitaxy (MBE)
»
MBE
Quantum Design Magnetic Property Measurement System (MPMS)
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SQUID Magnetometry
Nanofabrication Facility
Focused Ion Beam
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Focused Ion Beam
Glovebox
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Synthesis and Fabrication
Polishing System
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Synthesis and Fabrication
SCSU (Southern Connecticut State University)
Dip-pen Nanolithography
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Lithography
Hitachi Tabletop Scanning Electron Microscope
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SEM
Ion Mill
Microtome
Olympus Inverted Metallurgical Microscope
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Optical Microscopy
Olympus Research Microscope
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Optical Microscopy
Philips Transmission Electron Microscope
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Transmission Electron Microscopy
Precision Low Speed Saw
TEM specimen Preparation Polisher
Zeiss Axio Lab Microscope
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Optical Microscopy
Zeiss Axio Scope Microscope
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Optical Microscopy
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