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Instruments
Instrument types
Atomic Content Characterization (43)
Atom probe (7)
Focused Ion Beam (23)
Electrical Characterization (20)
PPMS (11)
PPMS (4)
Free Electron Laser (3)
Magnetic Characterization (35)
SQUID Magnetometry (11)
Mass/Density Characterization (3)
Pycnometer (1)
Microscopy (372)
Electron Microscopy (171)
Transmission Electron Microscopy (54)
STEM (20)
SEM (63)
Electron Microscopy (7)
Image Analysis and Processing (41)
Optical Microscopy (50)
Near Field Scanning Microwave Microscopy (0)
Near Field Scanning Microwave Microscopy (1)
Confocal Fluorescence Microscopy (10)
Optical Microscopy (8)
Scanning Probe Microscopy (6)
Scanning Probe Microscopy (73)
Atomic Force Microscopy (37)
Scanning Tunneling Microscopy (1)
Scanning Tunneling Microscopy (5)
Optical Characterization (102)
Ellipsometry (7)
Solar Simulator (2)
Optical Spectrometry (19)
Polymer Characterization (75)
Circular Dichrosim (5)
Dynamic Light Scattering (11)
Gas Chromatography (6)
Gel Permeation Chromatography (18)
Profilometry (86)
Structural Characterization (316)
Porosimetry (3)
Dynamical Mechanical Analysis (8)
Rheometry (25)
Atom probe (2)
X-ray Diffraction (70)
Thermal Characterization (61)
Calorimetry (15)
Thermo-Gravimetric Analysis (12)
Computing / Simulation (47)
Image Analysis and Processing (0)
Synthesis and Fabrication (239)
Crystal Growth (7)
MOCVD / MOVPE (0)
MBE (5)
Microwave Reactor (3)
Ovens (16)
Rapid Thermal Annealer (1)
Vacuum Ovens (4)
Thin Film Processing and Deposition (134)
Thin Film Deposition (56)
MOCVD / MOVPE (0)
PECVD (2)
MBE (0)
Pulsed Laser Deposition (5)
Microfabrication / Microelectronics / Clean Room (71)
Lithography (27)
Etching (18)
Wire Bonding (7)
Focused Ion Beam (6)
Furnaces (21)
Polymer Processing (8)
Spectroscopy (114)
InfraRed Reflection Absorption Spectroscopy (IRRAS) (1)
LEED/Auger Electron Spectroscopy (4)
Rutherford Backscattering Spectrometry (2)
Electron Magnetic Resonance (0)
FTIR/Raman Spectroscopy (22)
SIMS (7)
XPS (14)
NMR - Nuclear Magnetic Resonance (20)
ICP Atomic Emission Spectroscopy (1)
Synchrotron Beam Line (1)
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