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University of Minnesota
UMN Materials Research Science and Engineering Center
Characterization Facility (CharFac)
Facility Primary Contact:
Greg Haugstad
More details about this Instrument
Auger Electron Spectroscopy
Instrument types
LEED/Auger Electron Spectroscopy
Make / Model :
Physical Electronics Model 545
Sample Imaging with ~ 2 µm resolution
Auger elemental mapping
Multi-spot surface analysis
Thin Film Elemental Depth Profiling to ~ 1µm using ion beam sputtering
Auger Spatial Resolution to ~ 10 µm
Multi-sample handling
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MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.