Description:

Wide-angle X-ray scattering is used to study structural characteristics and to identify powders, thin films, and crystals.

Microdiffraction can be used for x-ray analysis of very small samples or small areas of larger samples.  The x-ray beam can be collimated down to a 50 micron spot size.  A video-microscope and laser pointer allows for the beam's precise positioning.  The multi-wire two-dimensional area detector allows for quick data acquisition and orientation information.  This detector, combined with the 1/4 circle Eulerian cradle sample holder is perfect for pole figure (texture) analysis.

Equipment:

• Bruker-AXS Microdiffractometer with 2.2 kW Sealed Cu X-ray Source
• Incident Beam Monochromater
• 1/4 circle Eulerian Cradle Sample Holder
• Hi-Star 2-D Area Detector
• Temperature Control (-20° to 200° C)
• Optional Chromium X-Ray Source

Applications:

• Phase identification
• Thin-film analysis
• Lattice parameter determination
• Purity/quality control of materials
• Determination of crystallinity of polycrystalline materials
• Stress analysis
• Orientation of single crystals
• Particle size determination
• Pole figure (texture) analysis

Specifications:

• Bruker-AXS Microdiffractometer with 2.2 kW Sealed Cu X-ray Source
• Incident Beam Monochromater
• 1/4 circle Eulerian Cradle Sample Holder
• Hi-Star 2-D Area Detector
• Temperature Control (-20° to 200° C)
• Optional Chromium X-Ray Source