Description:

Wide-angle x-ray scattering is used to study structural characteristics and to identify powders, thin films, crystals, and solutions.  Data analysis is performed using Materials Data Incorporated's JADE 7.0 software package with whole pattern fitting.  Phase identification is possible using ICDD's PDF-4 database.  The 40 position sample changer can be used to analyze a large number of samples automatically.

Equipment:

• Siemens D-500 Diffractometer with 2.2 kW sealed cobalt source
• Single Crystal Graphite Monochromater
• Scintillation Counter Detector

Accessories:

• Laue camera for orientation of single crystals
• ICDD library on CD-ROM
• 40 position sample changer
• High Temperature Stage (ambient to 1400°C) with atmospheric control

Applications:

• Phase identification
• Thin-film analysis
• Lattice parameter determination
• Purity/quality control of materials
• Determination of crystallinity of polycrystalline materials
• Stress analysis
• Orientation of single crystals
• Analysis of superlattice structures
• Particle size determination
• Quantitative analysis

Specifications:

• Siemens D-500 Diffractometer with 2.2 kW sealed cobalt source
• Single Crystal Graphite Monochromater
• Scintillation Counter Detector