Skip to:

MRFN Member Login
Program Application

Helios Nanolab 600 Dual Beam Focused Ion Beam Milling System (FIB)

Make / Model : 

Helios Nanolab 600

Configured to carry out nano-scale characterization and nano-machining on a wide-range of materials from various study areas such as biotechnology, and materials and energy research. This instrument has magnetic immersion electron optics to give 0.9 nm resolution at 15kV. A high brightness field electron emitter can deliver a beam current up to 22 nA and the accelerating voltage from 350V to 30kV. The ion optics produces a resolution of 5.0 nm at 30KV and liquid Gallium emitter delivers 20 nA ion current and the voltage ranging from 0.5 kV to 30kV.

Remote Access to Instrument: 
No