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Woollam M-2000 Ellipsometer

This spectroscopic ellipsometer is used to non-destructively analyze thin films using elliptically polarized light. It utilizes a rotating compensator with high-speed CCD detection system to measure all wavelengths simultaneously. This allows for rapid and accurate data collection across a wide spectral range. When coupled with the system’s automated tilt and Z-height optimization, can quickly and easily determining film thickness and optical constants.