Skip to:

MRFN Member Login
Program Application

Gaertner Ellipsometer

Make / Model : 

L116A

Description

Ellipsometry is a non-destructive method of measuring the index of refraction and film thickness of a dielectric film on a reflecting substrate. It is a highly accurate and repeatable measurement. Ellipsometry involves illuminating the surfae of a sample with monochromatic light having a known an dcontrollable state of polarization and analyzing the poarization state of the reflected light.