Skip to:

MRFN Member Login
Program Application

Rudolph Ellipsometer

Make / Model : 



Ellipsometry is a non-destructive method of measuring the index of refraction and film thickness of dielectric film on a reflecting substrate. It is a highly accurate and repeatable measurement. Ellipsometry invovles illuminating the surface of a sample with monochromatic light having a known and controllable state of polarization and analyzing the polarization state of the reflected light.