Key Specifications:
- Two x-ray sources: Monochromatic Al and Dual anode (Mg/Al)
- High sensitivity is achieved with a combination of electrostatic and magnetic lenses, a 165 mm hemispherical analyzer and multi channeltron detection
- Coaxial charge neutralization system
- Variable temperature (150-750 K) sample stage
- XPS imaging (30 micron spot) and multipoint spectroscopy
- Depth profiling with argon ion bombardment
- Automated sample stage and XYZ manipulator for angle resolved measurements
- High vacuum loadlock and preparative chamber
- Sample holder capable of holding multiple samples
- Kratos Vision and CASA XPS analysis software
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