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PANalytical Multipurpose Diffractometer

Instrument types

This diffractometer can be used to collect XRPD, GIXD, XRR, and residual stress data. Some texture analysis is also possible. Sample sizes may be as large as 60mm diameter by 3-12mm thick, though a more typical sample size is 10-20mm diameter. Data collection modes can be changed between high-speed high-resolution divergent beam diffraction and parallel beam diffraction. There are several accessories for this instrument, including an X'Celerator position sensitive detector, a furnace for in-situ high temperature measurements, a cryostat for in-situ low temperature measurements, a diffracted beam monochromator, and a 15-position automatic sample changer.

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