- X-ray source: Philips high intensity ceramic sealed tube (3kW)
- Wavelength: Cu Ka (1.5405 Å)
- Incident beam optics: 2 interchangeable fixed slits and one Soller slit.
- Diffracted beam optics: fixed slit plus programmable receiving slit, graphite analyzer
- Detectors: sealed proportional counter and X'celerator PSD for high speed data collection
- Sample stage: powder stage, texture cradle with sample translation
- Software: Philips X’PERT suite: Data Collector, Graphics & Identify, Texture
![](http://www.mrl.ucsb.edu/sites/default/files/mrl_images/instruments/XPERT-powder-225.jpg) |
![](http://www.mrl.ucsb.edu/sites/default/files/mrl_images/instruments/MPD-II-225.jpg) |
XPERT Powder (I) - for high-speed phase identification |
XPERT Thin Film (II) - for thin film, grazing-incidence XRD, texture measurement |
Example Data
![](http://www.mrl.ucsb.edu/sites/default/files/mrl_images/instruments/corundum-data.jpg)
XRD data of a curundum plate collected on XPERT powder diffractometer