The JEOL 2010 TEM is available for both conventional and high resolution TEM imaging. It is equipped with single tilt, double-tilt, heating and cooling sample holders for a wide range of imaging experiments. The analytical objective lens pole piece on this microscope allows for sample tilting up to 45 degrees, yet maintains a point-to-point resolution of 0.25 nm. In addition to the conventional plate camera, this instrument is equipped with a Gatan Peltier cooled CCD imaging system for high quality digital imaging.