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Princeton University
Princeton Center for Complex Materials
Imaging and Analysis Center
Facility Primary Contact:
Nan Yao
Keithley 4200-SCS Semiconductor Characterization System
Instrument types
Thermal Characterization
News
Shared instrumentation facilities: Benefiting researchers and universities, and sustaining research excellence
Making the Best of a Bad Situation: A Characterization Seminar Series
How NSF's Materials Research Facilities Network helps bolster the field of materials science and engineering
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