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University of Texas – Austin
Center for Dynamics and Control of Materials
CDCM Shared Experimental Facilities
Facility Primary Contact:
Bin Fang
Scanning near-field optical microscope (NeaSNOM)
Instrument types
Optical Microscopy
Near Field Scanning Microwave Microscopy
Optical Characterization
Optical Spectrometry
Spectroscopy
FTIR/Raman Spectroscopy
A scanning near-field optical microscope with 20 nm spatial resolution.
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