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Cold Field Emission Gun Scanning Electron Microscope

Instrument types
Make / Model : 

Hitachi S-4700

A Cold Field Emission Gun Scanning Electron Microscope (FEGSEM) of "below‑the‑lens" design capable of (manufacturer's claims) 1.5 nm resolution at 15 kV, 12 mm W.D.; and 2.5 nm resolution at 1 k, 2.5 mm W.D.  Magnification ranges from 30X to 500,000X.  Specimen tilt at 12 mm W.D. up to 45 degrees.  Electron source is a cold FE gun producing high brightness (~ 2 x 109 A / cm2/sr) with little energy spread (0.2 - 0.3 eV).  The "below‑the‑lens" design and large sample chamber port permits samples as large as 100 mm diameter x 17 mm thick.  Oil-free vacuum systems pump column and sample exchange.  Available image modes include secondary and backscattered electron images.  There are two secondary electron detectors; one above the objective lens, the other below.  Digital images may be acquired in BMP, TIFF, or JPEG file formats at 640 x 480, 1280 x 960, or 1560 x 1920 pixels. 

An Emitech cryo stage is available for use with samples prepared in the Emitech K-1250 Cryopreparation / Cryotransfer System


  • Hitachi S-4700 with a variety of non-cryo sample holders
  • CryoSEM observation using Emitech Cryo Stage, Model K-1250 Cryopreparation System, and a variety of sample holders
  • Backscatter imaging at TV rates and low voltage (threshold 2.5 kV on gold) with Autrata modified YAG (yttrium aluminum garnet, cerium doped) crystal
  • Keithly Specimen Current Detector


  • High-resolution topographic contrast (Se) and atomic number contrast (BSe) imaging of biological and non-biological samples in both room temperature and cryo modes
  • Applicable to imaging of immunogold labeled individual cells and bacteria


Specimen Stage,
Traverse X: 0 ~ 25 mm
Traverse Y: 0 ~ 25 mm
Traverse Z: 2.5 ~ 27.5 mm
Traverse T: -5 ~ +45 degrees
Traverse R: 360 degrees
Drive: Manual
Specimen Stage,
Traverses similar to above, but rotation limited to 30 degrees clockwise, and 180 degrees counterclockwise, from zero point.