Instrument
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Amray 1860 FEG high resolution SEM @
Electron Microscopy Facilities @
Materials Research Science Engineering Center
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Auxiliary Equipment @
The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison @
Wisconsin MRSEC
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Carl Zeiss Merlin SEM @
Materials Preparation and Measurement Laboratory (MPML) @
Chicago Materials Research Center
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Carl Zeiss Zigma VP FE SEM @
Electron Microscopy @
Center for Precision Assembly of Superstratic and Superatomic Solids
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Cold Field Emission Gun Scanning Electron Microscope @
Characterization Facility (CharFac) @
UMN Materials Research Science and Engineering Center
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Electron Backscatter Detector @
Electron Microscopy Cluster @
Cornell Center for Materials Research
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ESEM-FEI Quanta 200 Environmental SEM; 10nm Resolution, BSE, EDS, and Temperature Control @
Materials Characterization Lab @
Center for Nanoscale Science
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FEI 600 Quanta FEG ESEM @
Electron Microscopy Facility @
The Laboratory for Research on the Structure of Matter
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FEI Helios Nanolab SEM/FIB @
Electron Probe Instrumentation Center (EPIC) @
Northwestern University Materials Research Science and Engineering Center
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FEI Inspect S Electron Scanning Microscope w/ Cathodoluminescence System @
Microscopy and Microanalysis Facility @
Materials Research Laboratory: an NSF MRSEC
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FEI Magellan 400 Scanning Electron Microscope @
Electron and Optical Microscopy @
UMass Amherst Materials Research Science and Engineering Center
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FEI Nova NanoSEM 230 @
Materials Preparation and Measurement Laboratory (MPML) @
Chicago Materials Research Center
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FEI Nova NanoSEM 450 @
Electron Nanoscopy Instrumentation @
UNL Materials Research Science and Engineering Center
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FEI Quanta 200 FEG Environmental-SEM with EDS/EEL @
Imaging and Analysis Center @
Princeton Center for Complex Materials
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FEI Quanta 200 Field Emission Environmental SEM @
Orientation Imaging Microscopy (OIM) @
Carnegie Mellon University MRSEC
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FEI Quanta ESEM @
Electron Probe Instrumentation Center (EPIC) @
Northwestern University Materials Research Science and Engineering Center
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FEI Verios 460 XHR SEM with EDS @
Imaging and Analysis Center @
Princeton Center for Complex Materials
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FEI XL30 FEG-SEM @
Imaging and Analysis Center @
Princeton Center for Complex Materials
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FEI XL30 Sirion FEG Digital Electron Scanning Microscope @
Microscopy and Microanalysis Facility @
Materials Research Laboratory: an NSF MRSEC
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FEI XL40 SEM @
Imaging and Characterization Facility @
CRISP: Center for Research on Interface Structures and Phenomena
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FEI XL40 Sirion FEG Digital Scanning Microscope w/EDS @
Microscopy and Microanalysis Facility @
Materials Research Laboratory: an NSF MRSEC
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FESEM-FEI NanoSEM 630; 1.7nm Resolution, BSE, EDS, Beam Deceleration @
Materials Characterization Lab @
Center for Nanoscale Science
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FIB-FEI Quanta 200 3D FIB; 3.5nm SEM Resolution, 10nm Ga+ Beam, Pt GIS, and Selective Carbon Etch GIS @
Materials Characterization Lab @
Center for Nanoscale Science
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FIB-FEI Helios NanoLab 660; DualBeam SEM/FIB Platform-pushing the limits of extreme high resolution characterization in 2D an 3D, nanoprototyping, and sample preparation @
Materials Characterization Lab @
Center for Nanoscale Science
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Field Emission Gun Scanning Electron Microscope @
Characterization Facility (CharFac) @
UMN Materials Research Science and Engineering Center
-
Gatan Tensile Stages @
Triangle MRSEC Soft Matter Lab @
Research Triangle MRSEC
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Hitachi S-2700 @
Materials Preparation and Measurement Laboratory (MPML) @
Chicago Materials Research Center
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Hitachi S-3400N-II @
Electron Probe Instrumentation Center (EPIC) @
Northwestern University Materials Research Science and Engineering Center
-
Hitachi S-4800-II @
Electron Probe Instrumentation Center (EPIC) @
Northwestern University Materials Research Science and Engineering Center
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Hitachi SU-70 high resolution SEM @
Imaging and Characterization Facility @
CRISP: Center for Research on Interface Structures and Phenomena
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Hitachi SU8030 @
Electron Probe Instrumentation Center (EPIC) @
Northwestern University Materials Research Science and Engineering Center
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Hitachi Tabletop Scanning Electron Microscope @
SCSU (Southern Connecticut State University) @
CRISP: Center for Research on Interface Structures and Phenomena
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JEOL 6700F Scanning Electron Microscope @
Electron Microscopy Facilities @
Materials Research Science Engineering Center
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JEOL 7500F HRSEM @
Electron Microscopy Facility @
The Laboratory for Research on the Structure of Matter
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JEOL JSM 845 SEM @
Central Facility for Electron Microscopy @
Center for Advanced Materials Research
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JEOL JSM-6320 Scanning Electron Microscope @
Electron and Optical Microscopy @
UMass Amherst Materials Research Science and Engineering Center
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JEOL SEM @
Minnesota Nano Center (MNC) @
UMN Materials Research Science and Engineering Center
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Leica EM TiC 3X Ion Beam Milling System @
The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @
Wisconsin MRSEC
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LEO 1530 HRSEM @
Central Facility for Electron Microscopy @
Center for Advanced Materials Research
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LEO 1550 FESEM @
The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison @
Wisconsin MRSEC
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LEO Gemini 1525 @
Electron Probe Instrumentation Center (EPIC) @
Northwestern University Materials Research Science and Engineering Center
-
Nova 600 NovaLab Dual Beam Focused Ion Beam SEM @
Orientation Imaging Microscopy (OIM) @
Carnegie Mellon University MRSEC
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Nova Nano FE SEM 450 with a NPGS @
Electron Microscopy @
Center for Precision Assembly of Superstratic and Superatomic Solids
-
Philips XL40 FEGSEM @
Orientation Imaging Microscopy (OIM) @
Carnegie Mellon University MRSEC
-
Tescan Mira3 FESEM @
Electron Microscopy Cluster @
Cornell Center for Materials Research
-
Tescan S8252G Raman - SEM/FIB @
Characterization Laboratory @
Renewable Energy Materials Research Science and Engineering Center
-
Zeiss Auriga Focused Ion Beam FIB/FESEM @
The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @
Wisconsin MRSEC
-
Zeiss Gemini 300 FESEM @
The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @
Wisconsin MRSEC
-
Zeiss Gemini 450 FESEM @
The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @
Wisconsin MRSEC
-
Zeiss Gemini 500 SEM @
Electron Microscopy Cluster @
Cornell Center for Materials Research
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Zeiss Leo 1530 FESEM/EDS/EBSD @
The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @
Wisconsin MRSEC
-
Zeiss SEM and Electron Beam Lithography System @
Electron Microscopy Facilities @
Materials Research Science Engineering Center
-
Zeiss Sigma 500 SEM @
Electron Microscopy Cluster @
Cornell Center for Materials Research