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University of Minnesota
UMN Materials Research Science and Engineering Center
Characterization Facility (CharFac)
Facility Primary Contact:
Greg Haugstad
Instrument Technical Primary Contact:
Greg Haugstad
More details about this Instrument
Nanoscope V Multimode 8
Instrument types
Atomic Force Microscopy
Make / Model :
Bruker Nanoscope V Multimode 8
Specifications:
Nikon optical microscope with CCD and image capture for tip positioning.
Nano-K Biscuit vibration isolation platform.
Hysitron-SPM combination enables nanoindentation, microscratch, and other mechanical tests along with
in situ
high-resolution imaging.
Maximum load is approximately 2 mN and force resolution is 100 nN with Hysitron tester.
Maximum scan size 150 x 150 µm laterally and 5.6 µm vertically.
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