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Home
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Microscopy (372)
»
Scanning Probe Microscopy (73)
Atomic Force Microscopy
Instrument
AFM/MFM
@
Surface Characterization Facilities
@
Materials Research Science Engineering Center
Asylum Cypher ES AFM
@
Materials Preparation and Measurement Laboratory (MPML)
@
Chicago Materials Research Center
Asylum MFP-3D-BIO AFM
@
Materials Preparation and Measurement Laboratory (MPML)
@
Chicago Materials Research Center
Asylum MFP-3D-SA Atomic Force Microscope
@
Molecular Design Institute
@
NYU Materials Research Science and Engineering Center
Asylum-MFP3D-Bio-AFM-SPM
@
Materials Cluster
@
Cornell Center for Materials Research
Atomic Force Microscope: Asylum Research MFP-3D System
@
Texas Materials Institute
@
Center for Dynamics and Control of Materials
Atomic Force Microscopes: Park Scientific
@
Texas Materials Institute
@
Center for Dynamics and Control of Materials
Auxiliary Equipment
@
The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison
@
Wisconsin MRSEC
Bruker AXS Dimension Icon Atomic/Magnetic Force Microscope with ScanAsyst
@
NanoSystems Laboratory (NSL)
@
Center for Emergent Materials
Bruker Dimension AFM
@
Shared Materials Characterization Laboratory (SMCL)
@
Center for Precision Assembly of Superstratic and Superatomic Solids
Bruker Edge AFM
@
MEM-C Shared Facilities
@
Molecular Engineering Materials Center
Bruker Fastscan AFM
@
Imaging and Characterization Facility
@
CRISP: Center for Research on Interface Structures and Phenomena
Bruker Icon AFM
@
The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison
@
Wisconsin MRSEC
Bruker Icon AFM
@
MEM-C Shared Facilities
@
Molecular Engineering Materials Center
Bruker Multimode 5 AFM with Nanoscope IIIa Controller
@
Materials Preparation and Measurement Laboratory (MPML)
@
Chicago Materials Research Center
Bruker Multimode 8 AFM with Nanoscope V Controller
@
Materials Preparation and Measurement Laboratory (MPML)
@
Chicago Materials Research Center
Bruker Multimode 8 Atomic Force Microscope (AFM, SPM)
@
The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison
@
Wisconsin MRSEC
Bruker Multimode AFM
@
Imaging and Analysis Center
@
Princeton Center for Complex Materials
Bruker multimode AFM
@
Imaging and Characterization Facility
@
CRISP: Center for Research on Interface Structures and Phenomena
Bruker NanoMan AFM Dimension 3000 AFM
@
Imaging and Analysis Center
@
Princeton Center for Complex Materials
Denton Desk V chromium sputtering tool
@
Imaging and Characterization Facility
@
CRISP: Center for Research on Interface Structures and Phenomena
DI Dimension-3000 and Dimension-3100 AFM
@
Nanostructures Laboratory
@
UMass Amherst Materials Research Science and Engineering Center
DI Nanoscope-IV Multimode AFM
@
Nanostructures Laboratory
@
UMass Amherst Materials Research Science and Engineering Center
Dimension 3100 Atomic Force Microscope
@
Molecular Design Institute
@
NYU Materials Research Science and Engineering Center
Molecular Image Picoscan AFM
@
Surface Characterization Facilities
@
Materials Research Science Engineering Center
Multi-Mode Atomic Force Microscope
@
Molecular Design Institute
@
NYU Materials Research Science and Engineering Center
Nanoscope V Multimode 8
@
Characterization Facility (CharFac)
@
UMN Materials Research Science and Engineering Center
Scanning probe microscopy
@
Materials Research Laboratory Central Research Facilities
@
Illinois MRSEC
ThermoMicroscopes M5
@
Surface Preparation and Characterization Laboratory
@
Carnegie Mellon University MRSEC
People
Alexander E. Ribbe
@
UMass Amherst Materials Research Science and Engineering Center
Denis Pelekhov
@
Center for Emergent Materials
Jerry Hunter
@
Wisconsin MRSEC
John Jacobs
@
Wisconsin MRSEC
Julie Morasch
@
Wisconsin MRSEC
Justin Jureller
@
Chicago Materials Research Center
Kevin Silverstein
@
Cornell Center for Materials Research
Steve Kriske
@
Cornell Center for Materials Research
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