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University of Massachusetts Amherst
UMass Amherst Materials Research Science and Engineering Center
Electron and Optical Microscopy
Facility Primary Contact:
Alexander E. Ribbe
Instrument Technical Primary Contact:
Alexander E. Ribbe
,
Louis Raboin
More details about this Instrument
JEOL JSM-6320 Scanning Electron Microscope
Instrument types
SEM
Make / Model :
JEOL JSM-6320
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