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FEI Talos F200X Transmission/Scanning Transmission Electron Microscope (S/TEM)

Instrument types

FEI Talos combines high-resolution S/TEM and TEM imaging with energy dispersive x-ray spectroscopy signal detection and chemical characterization with compositional mapping. Max acc voltage of 200 kV, additional configuration of 80 kV.  X-FEG field emission source; high brightness, Total beam current >50 nA; VeloxTM S/TEM for improved imaging with a drift corrected frame integration (DFCI) engine, STEM high angle annular dark field (HAADF) resolution (nm) 0.16, EDX solid angle (srad) 0.9, TEM point resolution (nm) 0.25, TEM magnification range 25× - 1.5 M× . Full remote operation with automatic aperture system.