cold field emission technology -double condenser optics ensures not only the highest resolution;
full control on probe currents from 1pA to over 5nA - ideal for both, observation of even the most sensitive specimens, but also for elemental analysis (EDX) where today's SDD detectors easily will achieve several 10000 counts per second.
a large specimen chamber
equipped with the triple detector super ExB system
Oxford X-max 80 SDD EDS detector
standard Everhart-Thornley SE detector
spatial resolution of 1.0 nm at 15kV and 1.3 nm at 1kV
MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.
