The TEAM™ Software Suite, coupled with the Octane Elect and Octane Elite Energy Dispersive Spectroscopy (EDS) Systems is the most intuitive and easy to use analytical tool available for the SEM. The workflow functions are automated by integrating years of EDAX knowledge and expertise to work for you. Startup, Analysis, and Reporting are easy because the TEAM™ software automates each task. It is the only EDS technology that combines smart decision making and guidance for the novice with advanced features for the experienced user. Now you have the intelligence of an EDS expert every step of the way.
The TEAM™ Software Suite for the SEM was designed to save time and ensure accurate, reproducible results for a wide range of applications. Whether simply collecting a spectrum or performing complex phase analysis, the system and its touch screen capability make it easy to quickly get the results you want. The software is built with a modern interface optimized for running in multicore and multiprocessor environments. Our TEAM™ Software Suite offers Smart Features for startup, analysis, and reporting not found in any other system. The core components that make up this functionality include:
Smart Track’s environmental panel monitors system status; reports operating conditions for the detector, stage, column, and more; plus allows access to advanced controls. Smart Acquisition automates routine tasks for ease of use and times savings.
Smart Phase Mapping provides a higher level of analysis by automatically collecting spectra and generating phase maps with elemental distribution and associated spectra. Point analysis and line scan with next-generation EXpert ID enable fast and easy measurement of individual and multiple points from selected areas.
Octane Elite Super - 70 mm chip
The silicon nitride window offers major improvements compared to a polymer window, leading to greatly improved light element performance and significantly more critical data for the analyst.
The silicon nitride window offers superior low energy transmission compared to a polymer window.
The mechanical properties of SiN allow the use of thinly fabricated windows, offering a great benefit in terms of sensitivity and optimal low voltage analysis.
EDAX EDS systems with advanced detection electronics offer the highest throughput count rates on the market for the best possible analysis and increased productivity.
The material properties and durability of SiNensure the most robust and reliable detectors available for all EDS applications.
TEAM™ EBSD Analysis System combines the ease of use of the TEAM™ software platform with the analytical power of OIM to provide state of the art crystal structure characterization to all users.
Hikari Super - up to 1,400 indexed points per second
The indexing speed increases between each model are available at all camera resolutions, allowing real acquisition speeds to be achieved on both routine and challenging samples.
Features and Benefits
Data collection rates up to 1,400 indexed points per second
· Maps can be collected in minutes for efficient SEM use
Maximum EBSD camera sensitivity
· Beam currents as low as 100 pA
· Accelerating voltages as low as 5 kV
Precision orientation measurements to less than 0.1°
High indexing success rates
Integrated Forward Scatter Detector (FSD) for reviewing sample microstructure prior to performing EBSD scan
Compatible with Pattern Region of Interest Analysis System (PRIAS™) Live Imaging