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Bruker D8 Discover Diffractometer X-Ray Diffractometer (XRD)

Instrument types
Make / Model : 

Bruker Hi-Star XRD

The Bruker D8 Discover diffractometer is ideally suited for rapid phase identification, stress analysis, and texture determination. It also has mapping capabilities with ~0.1 mm lateral resolution and can be configured for small angle x-ray scattering (SAX).

Advanced X-ray Diffraction System for Materials Research Applications

The D8 DISCOVER with DAVINCI design increases ease-of-use with real-time component detection, plug-and-play functionality and fully integrated 2-dimensional XRD2 capabilities. These unique features allow the user to easily switch between all materials research X-ray diffraction applications, including reflectometry, high-resolution diffraction, in-plane grazing incidence diffraction (IP-GID), small angle X-ray scattering (SAXS), as well as residual stress and texture investigations.
Watch our D8 DISCOVER Video
Two-dimensional VÅNTEC-500 detector

For a 2-D detector, size is the most important feature. A large detector window not only enables increased data collection speed, it also provides information that is simply not accessible with 0-D, 1-D or smaller 2-D detectors. The VÅNTEC-500 detector features a huge 140 mm diameter window, covering up to about 80° (2θ) and a large γ-range.
SNAP-LOCK X-ray optics for tool-free switching of the diffraction geometry

The factory-aligned, SNAP-LOCK X-ray optics provide true ‘plug-and-play’ functionality, including automatic and tool-free switching of the diffraction geometry with minimal user intervention.

An X-ray optics module, a detector, or any accessory mounted onto the instrument registers itself in real-time with its relevant parameters and analytical capabilities, including powerful detection of possible component conflicts.

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