The Bruker Dimension Edge AFM measures nanometer-scale microscopy by rastering (over a surface of interest) a sharp probe, the z-position of which is controlled in a closed-loop feedback on a measure of the atomic forces on the probe by the surface. These forces are strongly dependent on the probe-surface distance, and so the z-adjustments required to maintain constant force during rastering are directly related to the topographical and morphological features. This AFM is inside of the 2D materials manipulation glovebox, allowing study of air- and water-sensitive samples prepared inside the glovebox with direct access to additional in-glovebox capabilities, e.g. optical microscopy, and 2D stacking. The Edge has an ergonomic design with facile set-up (sample loading, cantilever mounting and calibration) and scan control.