The Hyphenated Systems HS200A optical profiler combines Hyphenated systems Advanced Confocal Microscopy technology with the automation required for high throughput industrail environments. The 200mm platform is extremely versatile and suitable for nummerous applications. The nano scale 200A is designed for fast and non-invasive inspection and measurement of the 3-dimensional geometry of probe marks, probe cards, MEMS, micro lenses and similar micro and nano engineered or precision-machined structures. Offering Advanced Confocal Microscopy, bright field and dark field imaging on a single platform, the 200A is an exceptionally versatile and powerful analytical platform. In addition to routine measurements, these systems are especially well suited to measurements of high curvature, steep slope, rough surfaces and for measurements beneath glass windows or engineered semi-transparent films.