Instrument
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AFM-Bruker Dimension Icon; contact mode, tapping mode, peakforce tapping, PFQNM, MFM, PRM, EFM, PFKPFM, and SCM @
Materials Characterization Lab @
Center for Nanoscale Science
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AFM-Dimension 3100; contact mode, tapping mode, and phase imaging @
Materials Characterization Lab @
Center for Nanoscale Science
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Asylum Research Molecular Force Probe 3D atomic force microscope @
Triangle MRSEC Soft Matter Lab @
Research Triangle MRSEC
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Auriga 60 CrossBeam (FIB/FE-SEM) @
UD Keck Center for Advanced Microscopy and Microanalysis @
University of Delaware Center for Hybrid, Active, and Responsive Materials
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Bruker Hyperion FT-IR Spectrometer & Microscope @
Materials Cluster @
Cornell Center for Materials Research
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Carver 25 ton press @
Materials Cluster @
Cornell Center for Materials Research
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Confocal Microscope @
Minnesota Nano Center (MNC) @
UMN Materials Research Science and Engineering Center
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Dimension-3100 V SPM @
UD Keck Center for Advanced Microscopy and Microanalysis @
University of Delaware Center for Hybrid, Active, and Responsive Materials
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ESEM-FEI Quanta 200 Environmental SEM; 10nm Resolution, BSE, EDS, and Temperature Control @
Materials Characterization Lab @
Center for Nanoscale Science
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FEI Titan Aberration-corrected (S)TEM @
The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @
Materials Research Science and Engineering Center on Structured Interfaces
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FESEM-FEI NanoSEM 630; 1.7nm Resolution, BSE, EDS, Beam Deceleration @
Materials Characterization Lab @
Center for Nanoscale Science
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FIB-FEI Quanta 200 3D FIB; 3.5nm SEM Resolution, 10nm Ga+ Beam, Pt GIS, and Selective Carbon Etch GIS @
Materials Characterization Lab @
Center for Nanoscale Science
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FIB-FEI Helios NanoLab 660; DualBeam SEM/FIB Platform-pushing the limits of extreme high resolution characterization in 2D an 3D, nanoprototyping, and sample preparation @
Materials Characterization Lab @
Center for Nanoscale Science
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JEM-2010F (200kV FE-TEM) @
UD Keck Center for Advanced Microscopy and Microanalysis @
University of Delaware Center for Hybrid, Active, and Responsive Materials
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JEM-3010 (300kV TEM) @
UD Keck Center for Advanced Microscopy and Microanalysis @
University of Delaware Center for Hybrid, Active, and Responsive Materials
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JSM-7400F (FE-SEM) @
UD Keck Center for Advanced Microscopy and Microanalysis @
University of Delaware Center for Hybrid, Active, and Responsive Materials
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LabRamHR Evolution Confocal Raman Microscope @
Materials Preparation and Measurement Laboratory (MPML) @
Chicago Materials Research Center
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Leica Cryo-Microtome @
Imaging and Characterization Facility @
CRISP: Center for Research on Interface Structures and Phenomena
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Meiji Techno Metallurgical Microscope System @
Triangle MRSEC Soft Matter Lab @
Research Triangle MRSEC
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Microtomography Lab: MicroCT @
Utah MRSEC Affiliated Labs @
Next Generation Materials for Plasmonics and Organic Spintronics
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MultiMode NanoScope V SPM @
UD Keck Center for Advanced Microscopy and Microanalysis @
University of Delaware Center for Hybrid, Active, and Responsive Materials
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Nanoindentation-Hysitron TriboIndenter TI 900; <1nN Load Resolution, Load or Displacement Controlled Measurments @
Materials Characterization Lab @
Center for Nanoscale Science
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Olympus BXiS Upright Microscope @
Triangle MRSEC Soft Matter Lab @
Research Triangle MRSEC
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Renishaw InVia Confocal Raman microscope @
Materials Cluster @
Cornell Center for Materials Research
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STEM-FEI Titan 3 G2; 0.7A Resolution, EDS, EELS, and EFTEM @
Materials Characterization Lab @
Center for Nanoscale Science
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STEM-JEOL 2010F; 2.0A Resolution, EDS, and EELS @
Materials Characterization Lab @
Center for Nanoscale Science
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Talos F200C (200kV FE-TEM) @
UD Keck Center for Advanced Microscopy and Microanalysis @
University of Delaware Center for Hybrid, Active, and Responsive Materials
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Tecnai G2 12 (120kV TEM) @
UD Keck Center for Advanced Microscopy and Microanalysis @
University of Delaware Center for Hybrid, Active, and Responsive Materials
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TEM-JEOL 2010; 2.3A Resolution, EDS, EELS and EFTEM @
Materials Characterization Lab @
Center for Nanoscale Science
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TEM-Phillips 420; 3.4A Resolution with EDS @
Materials Characterization Lab @
Center for Nanoscale Science
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Vibrational (Anasys Nano IR2, FTIR, ATIR, Rama Spectrometer, neaSNOM Microscope) @
UD Advanced Materials Characterization Lab @
University of Delaware Center for Hybrid, Active, and Responsive Materials