This system is capable of making sensitive infrared transmission and reflection measurements. Two detectors are available: liquid nitrogen cooled mercury cadmium telluride (MCT) and room temperature deuterated triglycine sulfate (DTGS). Detector choice determines range and sensitivity. Two beam splitters are also available: KBr and quartz.

This system also has an attached Photoelastic Modulation (PEM) module. This module allows for comparisons of polarization response from reflective samples with the use of polarization modulation infrared reflection absorption spectroscopy (PM-IRRAS). This technique is especially sensitive for measurements of thin films on metals. This FT-IR is also the source for the Sentech SENDIRA FT-IR Ellipsometer.