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Agilent SuperNova SCXRD

Instrument types

A single crystal X-ray diffractometer to determine full crystal structures of organic and inorganic solids. System consists of a Mo/Cu dual micro-focus source of 50W. Kappa Geometry Goniometer with 0.00125° resolution for Omega and Theta, 0.0025 ° for Kappa and 0.005 ° for Phi. Scanning speed range of 0.005-3.0 °/sec. Eos S2 CCD detector. The sample can be cooled or heated between 100-400 K.