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University of Utah
Next Generation Materials for Plasmonics and Organic Spintronics
UtahNanofab
Facility Primary Contact:
Ian Harvey
Instrument Technical Primary Contact:
Tony Olsen
More details about this Instrument
Thin Film Thickness Measurement System
Make / Model :
Nanospec 3000
Nanospec 3000 Reflectometer for measuring thickness of thin films.
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