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Johns Hopkins University
Materials Research Science Engineering Center
X-Ray Characterization
Instrument Technical Primary Contact:
Chia-Ling Chien
More details about this Instrument
Philips X'Pert MRD Diffractometer
Make / Model :
Philips X'Pert MRD Diffractometer
FEATURES:
Three detectors, angular resolution up to 0.003 degrees
Pole figures
Low angle relectometry
Seven-axis sample positioning
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