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Johns Hopkins University
Materials Research Science Engineering Center
X-Ray Characterization
Instrument Technical Primary Contact:
Peter Searson
More details about this Instrument
X-Ray Photoelectron Spectrometer
Instrument types
XPS
News
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Making the Best of a Bad Situation: A Characterization Seminar Series
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MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.