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Program Application

Surface Characterization Facilities


  1. AFM/MFM

  2. Molecular Image Picoscan AFM

  3. STM Tip Etching and Coating

  4. Tencor Thin Film Profilometer

  5. Topometrix Discoverer STM and AFM

  6. X-Ray Photoelectron Spectrometer



    • Compositional analysis
    • Oxidation states of ionic solids
    • Analysis area from 600 nm to 1mm diameter
    • Composition depth profiles