Analytical Instrumentation Facility (AIF) operates and maintains and develops state-of-the-art materials analysis instruments.
(Also known as AFM) Produces high resolution 3-D images by scanning a physical probe over a sample surface, resulting in a topographical map of the surface. The D3000 can accomodate samples as large as 150mm diam and 12 mm thick. The Multimode requires smaller samples (10x10x5mm).
SEM combined with a focused-ion beam which allows for 3-D characterization and nanoanalysis, TEM sample preparation, or structural modification of sample surfaces on the nanometer scale.
Advanced SEM with the ability to do elemental mapping at the atomic level, to collect characteristic X-Ray signals at high counts per second, and to collect electron energy-loss spectrum at the atomic level.
The FEI Verios 460L field-emiission scanning electron microscope (FESEM) is an ultra-high resolution Schottkey emittter SEM. Through clever design, it allows for ultra-high resolution at low energy on insulating samples with no conductive coating. It is equipped with a wide array of low and high energy electron detectors including a transmission detector and an energy dispersive X-ray spectrometer.
High resolution thermionic SEM. Variable pressure can be controlled depending on whether the samples are insulators or conductors.
AIF's Hysitron Ubi-1 Nanoidenter is a quasistatic indentation system for nanomechanical testing of mechanical properties, including Young's modulus, hardness, and fracture toughness.
Highly sensitive surface analytical technique using a pulsed ion beam and time-of-flight analyzer to produce mass spectra from the outer 1-2nm of materials. Useful for both elemental and molecular surface analysis
Offers high quality imaging in diffraction contrast, diffraction patterns, in-situ experiments (heating, cooling, tensile), and capability to study biological samples (at low kV)
Ultra-high resolution scanning transmission electron microscope capable of obtaining lattice resolution images with chemical composition information (EDS/EELS/GIF).
Cuts sections as thin as 90-500 nm from soft materials for TEM, SEM, AFM, OM or SIMS analysis. Also has attached cryo unit for sectioning very soft materials at low temperatures.
XRD is useful for determining atomic and molecular structures of materials. This X-ray platform can be used for the analysis of powders, thin films, nanomaterials and solid objects.
Surface analysis technique providing elemental and chemical bonding information from the very top surface of a specimen. Elemental characterization can be achieved with about 0.1% detection limit.
The system incorporates a high resolution θ/θ closed loop goniometer drive system, cross beam optics (CBO), an in-plane scattering arm, and an optional 9.0 kW rotating anode generator.
MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.
