Skip to:

MRFN Member Login
Program Application

FEI Verios extreme-resolution SEM

Instrument types

The FEI Verios 460L field-emiission scanning electron microscope (FESEM) is an ultra-high resolution Schottkey emittter SEM. Through clever design, it allows for ultra-high resolution at low energy on insulating samples with no conductive coating. It is equipped with a wide array of low and high energy electron detectors including a transmission detector and an energy dispersive X-ray spectrometer. 

Further Information