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Optical Characterization (102)
Ellipsometry
People
Anna Kiyanova
@
Wisconsin MRSEC
Jerry Hunter
@
Wisconsin MRSEC
Instrument
Auxiliary Equipment
@
The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison
@
Wisconsin MRSEC
Gaertner Stokes WAFERSKAN Ellipsometer
@
Materials Preparation and Measurement Laboratory (MPML)
@
Chicago Materials Research Center
JA Woollam IR-VASE Mark II Ellipsometer
@
The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison
@
Wisconsin MRSEC
JA Woollam VASE+AR Ellipsometer
@
The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison
@
Wisconsin MRSEC
Woollam Alpha-SE Ellipsometer
@
Shared Materials Characterization Laboratory (SMCL)
@
Center for Precision Assembly of Superstratic and Superatomic Solids
News
Shared instrumentation facilities: Benefiting researchers and universities, and sustaining research excellence
Making the Best of a Bad Situation: A Characterization Seminar Series
How NSF's Materials Research Facilities Network helps bolster the field of materials science and engineering
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MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.