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Optical Characterization (22)
Ellipsometry
Instrument
Auxiliary Equipment
@
The Soft Materials Laboratory (SML) at the University of Wisconsin-Madison
@
Materials Research Science and Engineering Center on Structured Interfaces
Gaertner Stokes WAFERSKAN Ellipsometer
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Materials Preparation and Measurement Laboratory (MPML)
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Chicago Materials Research Center
JA Woollam IR-VASE Mark II Ellipsometer
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The Soft Materials Laboratory (SML) at the University of Wisconsin-Madison
@
Materials Research Science and Engineering Center on Structured Interfaces
JA Woollam VASE+AR Ellipsometer
@
The Soft Materials Laboratory (SML) at the University of Wisconsin-Madison
@
Materials Research Science and Engineering Center on Structured Interfaces
Woollam Alpha-SE Ellipsometer
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Shared Materials Characterization Laboratory (SMCL)
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Center for Precision Assembly of Superstratic and Superatomic Solids
People
Ediger Mark
@
Materials Research Science and Engineering Center on Structured Interfaces
Jerry Hunter
@
Materials Research Science and Engineering Center on Structured Interfaces
News
How NSF's Materials Research Facilities Network helps bolster the field of materials science and engineering
UW-Madison adds new Plasma Focused ion beam and X-ray diffraction equipment
Cornell Center for Materials Research adds 300kV Fei Titan Themis Cryo-S/TEM to shared facilities
Read Other News
MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.