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Optical Characterization (109)
Ellipsometry
People
Anna Kiyanova
@
Materials Research Science and Engineering Center on Structured Interfaces
Jerry Hunter
@
Materials Research Science and Engineering Center on Structured Interfaces
Mark Ediger
@
Materials Research Science and Engineering Center on Structured Interfaces
Instrument
Auxiliary Equipment
@
The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison
@
Materials Research Science and Engineering Center on Structured Interfaces
Gaertner Stokes WAFERSKAN Ellipsometer
@
Materials Preparation and Measurement Laboratory (MPML)
@
Chicago Materials Research Center
JA Woollam IR-VASE Mark II Ellipsometer
@
The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison
@
Materials Research Science and Engineering Center on Structured Interfaces
JA Woollam VASE+AR Ellipsometer
@
The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison
@
Materials Research Science and Engineering Center on Structured Interfaces
Woollam Alpha-SE Ellipsometer
@
Shared Materials Characterization Laboratory (SMCL)
@
Center for Precision Assembly of Superstratic and Superatomic Solids
News
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