Instrument
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AES-Physical Electronics 670; 50nm spatial resolution; in situ fracture stage @
Materials Characterization Lab @
Center for Nanoscale Science
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Allied Multiprep polishers @
Electron Microscopy Cluster @
Cornell Center for Materials Research
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Carl Zeiss Merlin SEM @
Materials Preparation and Measurement Laboratory (MPML) @
Chicago Materials Research Center
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Electron Microscopy Core @
Materials Research Laboratory Central Research Facilities @
Illinois MRSEC
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ESEM-FEI Quanta 200 Environmental SEM; 10nm Resolution, BSE, EDS, and Temperature Control @
Materials Characterization Lab @
Center for Nanoscale Science
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FEI Tecnai Osiris (S)TEM @
Electron Nanoscopy Instrumentation @
UNL Materials Research Science and Engineering Center
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FEI Titan Aberration-corrected (S)TEM @
The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @
Materials Research Science and Engineering Center on Structured Interfaces
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FEI Titan Cryo-S/TEM 300kV @
Electron Microscopy Cluster @
Cornell Center for Materials Research
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FEI Verios extreme-resolution SEM @
Analytical Instrumentation Facility (AIF) @
Research Triangle MRSEC
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FESEM-FEI NanoSEM 630; 1.7nm Resolution, BSE, EDS, Beam Deceleration @
Materials Characterization Lab @
Center for Nanoscale Science
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FIB-FEI Quanta 200 3D FIB; 3.5nm SEM Resolution, 10nm Ga+ Beam, Pt GIS, and Selective Carbon Etch GIS @
Materials Characterization Lab @
Center for Nanoscale Science
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FIB-FEI Helios NanoLab 660; DualBeam SEM/FIB Platform-pushing the limits of extreme high resolution characterization in 2D an 3D, nanoprototyping, and sample preparation @
Materials Characterization Lab @
Center for Nanoscale Science
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Fischione 1010 Ion mill @
Electron Microscopy Cluster @
Cornell Center for Materials Research
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JEOL 8600 Electron Microprobe @
Electron Microscopy Facilities @
Materials Research Science Engineering Center
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Leica EM UC7/FC7 Cryoultramicrotome @
Electron Microscopy Cluster @
Cornell Center for Materials Research
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Leica Ultracut UCT Ultramicrotome @
Electron Microscopy Cluster @
Cornell Center for Materials Research
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Multi wavelength TIRF microscope @
Light Microscopy Facility @
The Bioinspired Soft Materials Center
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Probe Station @
Shared Materials Instrumentation Facility (SMIF) @
Research Triangle MRSEC
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Specimen Preparation Equipment @
Electron Nanoscopy Instrumentation @
UNL Materials Research Science and Engineering Center
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STEM-FEI Titan 3 G2; 0.7A Resolution, EDS, EELS, and EFTEM @
Materials Characterization Lab @
Center for Nanoscale Science
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STEM-JEOL 2010F; 2.0A Resolution, EDS, and EELS @
Materials Characterization Lab @
Center for Nanoscale Science
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Tecnai TF-30 300KV Field Emission Scanning Transmission Electron Microscope (FE STEM) @
The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @
Materials Research Science and Engineering Center on Structured Interfaces
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TEM-JEOL 2010; 2.3A Resolution, EDS, EELS and EFTEM @
Materials Characterization Lab @
Center for Nanoscale Science
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TEM-Phillips 420; 3.4A Resolution with EDS @
Materials Characterization Lab @
Center for Nanoscale Science