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Electron Microscopy

Instrument

AES-Physical Electronics 670; 50nm spatial resolution; in situ fracture stage @ Materials Characterization Lab @ Center for Nanoscale Science
Allied Multiprep polishers @ Electron Microscopy Cluster @ Cornell Center for Materials Research
Carl Zeiss Merlin SEM @ Materials Preparation and Measurement Laboratory (MPML) @ Chicago Materials Research Center
Electron Microscopy Core @ Materials Research Laboratory Central Research Facilities @ Illinois MRSEC
ESEM-FEI Quanta 200 Environmental SEM; 10nm Resolution, BSE, EDS, and Temperature Control @ Materials Characterization Lab @ Center for Nanoscale Science
FEI Tecnai Osiris (S)TEM @ Electron Nanoscopy Instrumentation @ UNL Materials Research Science and Engineering Center
FEI Titan Aberration-corrected (S)TEM @ The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @ Wisconsin MRSEC
FEI Titan Cryo-S/TEM 300kV @ Electron Microscopy Cluster @ Cornell Center for Materials Research
FEI Verios extreme-resolution SEM @ Analytical Instrumentation Facility (AIF) @ Research Triangle MRSEC
FESEM-FEI NanoSEM 630; 1.7nm Resolution, BSE, EDS, Beam Deceleration @ Materials Characterization Lab @ Center for Nanoscale Science
FIB-FEI Quanta 200 3D FIB; 3.5nm SEM Resolution, 10nm Ga+ Beam, Pt GIS, and Selective Carbon Etch GIS @ Materials Characterization Lab @ Center for Nanoscale Science
FIB-FEI Helios NanoLab 660; DualBeam SEM/FIB Platform-pushing the limits of extreme high resolution characterization in 2D an 3D, nanoprototyping, and sample preparation @ Materials Characterization Lab @ Center for Nanoscale Science
Fischione 1010 Ion mill @ Electron Microscopy Cluster @ Cornell Center for Materials Research
JEOL 8600 Electron Microprobe @ Electron Microscopy Facilities @ Materials Research Science Engineering Center
Leica EM UC7/FC7 Cryoultramicrotome @ Electron Microscopy Cluster @ Cornell Center for Materials Research
Leica Ultracut UCT Ultramicrotome @ Electron Microscopy Cluster @ Cornell Center for Materials Research
Multi wavelength TIRF microscope @ Light Microscopy Facility @ The Bioinspired Soft Materials Center
Probe Station @ Shared Materials Instrumentation Facility (SMIF) @ Research Triangle MRSEC
Specimen Preparation Equipment @ Electron Nanoscopy Instrumentation @ UNL Materials Research Science and Engineering Center
STEM-FEI Titan 3 G2; 0.7A Resolution, EDS, EELS, and EFTEM @ Materials Characterization Lab @ Center for Nanoscale Science
STEM-JEOL 2010F; 2.0A Resolution, EDS, and EELS @ Materials Characterization Lab @ Center for Nanoscale Science
Tecnai TF-30 300KV Field Emission Scanning Transmission Electron Microscope (FE STEM) @ The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @ Wisconsin MRSEC
TEM-JEOL 2010; 2.3A Resolution, EDS, EELS and EFTEM @ Materials Characterization Lab @ Center for Nanoscale Science
TEM-Phillips 420; 3.4A Resolution with EDS @ Materials Characterization Lab @ Center for Nanoscale Science

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